SPT7830 datasheet(3/8 Pages) CADEKA

3 / 8 page

12/29/99

SPT7830

ELECTRICAL SPECIFICATIONS

TA = +25 °C, VDD = +5.0 V, VIN = 0 to +3 V, fCLK = 35 MHz, fS = 2.5 MSPS, VREF+ = +3.0 V, VREF– = 0.0 V, unless otherwise specified.

TEST

PARAMETERS

CONDITIONS

LEVEL

MIN

TYP

MAX

UNITS

Dynamic Performance

Effective Number of Bits

fIN = 500 kHz

8.9

Bits

fIN = 1 MHz

8.5

Bits

Signal-to-Noise Ratio

fIN = 500 kHz

fIN = 1 MHz

Harmonic Distortion

fIN = 500 kHz

fIN = 1 MHz

Power Supply Requirements

+VDD Supply Voltage

5.5

+VDD Supply Current

VDD = +3.0 V

5.4

VDD = +5.0 V

Power Dissipation3

VDD = +3.0 V

VDD = +5.0 V

3 Excluding reference ladder.

TEST LEVEL CODES

All electrical characteristics are subject to the

following conditions:

All parameters having min/max specifications

are guaranteed. The Test Level column indi-

cates the specific device testing actually per-

formed during production and Quality Assur-

ance inspection. Any blank section in the data

column indicates that the specification is not

tested at the specified condition.

TEST PROCEDURE

100% production tested at the specified temperature.

100% production tested at TA=+25 °C, and sample

tested at the specified temperatures.

QA sample tested only at the specified temperatures.

Parameter is guaranteed (but not tested) by design

and characterization data.

Parameter is a typical value for information purposes

only.

100% production tested at TA = +25 °C. Parameter is

guaranteed over specified temperature range.

TEST LEVEL

III

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