MSP430F42xA

MIXED SIGNAL MICROCONTROLLER

SLAS587 -- FEBRUARY 2008

31

POST OFFICE BOX 655303

electrical characteristics over recommended operating free-air temperature (unless otherwise

noted) (continued)

flash memory

PARAMETER

TEST

CONDITIONS

MIN

NOM

MAX

UNIT

ERASE)

Program and erase supply voltage

2.7

3.6

V

Flash timing generator frequency

257

476

kHz

2.7 V/ 3.6 V

3

5

mA

2.7 V/ 3.6 V

3

7

mA

Cumulative program time

seeNote1

2.7 V/ 3.6 V

10

ms

Cumulative mass erase time

seeNote2

2.7 V/ 3.6 V

200

ms

Program/erase endurance

cycles

Data retention duration

100

years

Word or byte program time

35

Block program time for first byte or word

30

Block program time for each additional byte or word

see Note 3

21

t

Block program end-sequence wait time

seeNote3

6

Mass erase time

5297

Segment erase time

4819

NOTES: 1. The cumulative programming time must not be exceeded when writing to a 64-byte flash block. This parameter applies to all

programming methods: individual word/byte write and block write modes.

achieve the required cumulative mass erase time the flash controller’s mass erase operation can be repeated until this time is met.

(A worst case minimum of 19 cycles are required).

JTAG interface

PARAMETER

TEST

CONDITIONS

MIN

NOM

MAX

UNIT

f

TCK input frequency

see Note 1

2.2 V

0

5

MHz

TCK input frequency

seeNote1

3V

0

10

MHz

Internal pullup resistance on TMS, TCK, TDI/TCLK

seeNote2

2.2 V/ 3 V

25

60

90

kΩ

2. TMS, TDI/TCLK, and TCK pullup resistors are implemented in all versions.

JTAG fuse (see Note 1)

PARAMETER

TEST

CONDITIONS

MIN

NOM

MAX

UNIT

Supply voltage during fuse-blow condition

2.5

V

Voltage level on TDI/TCLK for fuse-blow

6

7

V

Supply current into TDI/TCLK during fuse-blow

100

mA

Time to blow fuse

1

ms

NOTES: 1. Once the fuse is blown, no further access to the MSP430 JTAG/Test and emulation features is possible. The JTAG block is switched

to bypass mode.