PCM5100A, PCM5101A, PCM5102A

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SLAS859 – MAY 2012

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

DEVICE INFORMATION

TERMINAL FUNCTIONS, PCM510xA

PCM510xA (top view)

Table 2. TERMINAL FUNCTIONS, PCM510xA

TERMINAL

I/O

DESCRIPTION

NAME

NO.

CPVDD

1

—

Charge pump power supply, 3.3V

CAPP

2

O

Charge pump flying capacitor terminal for positive rail

CPGND

3

—

Charge pump ground

CAPM

4

O

Charge pump flying capacitor terminal for negative rail

VNEG

5

O

Negative charge pump rail terminal for decoupling, -3.3V

OUTL

6

O

Analog output from DAC left channel

OUTR

7

O

Analog output from DAC right channel

AVDD

8

-—

Analog power supply, 3.3V

AGND

9

—

Analog ground

DEMP

10

I

FLT

11

I

Filter select : Normal latency (Low) / Low latency (High)

SCK

12

I

BCK

13

I

DIN

14

I

LRCK

15

I

FMT

16

I

XSMT

17

I

Internal logic supply rail terminal for decoupling, or external 1.8V supply

LDOO

18

—

terminal

DGND

19

—

Digital ground

DVDD

20

—

Digital power supply, 1.8V or 3.3V

(1)

Failsafe LVCMOS Schmitt trigger input

Copyright © 2012, Texas Instruments Incorporated

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