S29AS008J datasheet(51/55 Pages) SPANSION

51 / 55 page

November 9, 2011 S29AS008J_00_09

S29AS008J

Data

She e t

19. Erase and Programming Performance

Notes

1. Typical program and erase times assume the following conditions: 25°C, VCC = 1.8 V, 100,000 cycles, checkerboard data pattern.

2. Under worst case conditions of 90°C, VCC = 1.65 V, 1,000,000 cycles.

3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes program faster

than the maximum program times listed.

4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.

5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See Table 11.1

on page 33 for further information on command definitions.

6. The device has a minimum erase and program cycle endurance of 100,000 cycles per sector.

20. Package Pin Capacitance

Notes

1. Sampled, not 100% tested.

2. Test conditions TA = 25°C, f = 1.0 MHz.

Parameter

Typ (Note 1)

Max (Note 2)

Unit

Comments

Sector Erase Time

0.5

Excludes 00h programming

prior to erasure (Note 4)

Chip Erase Time

11.5

Byte Programming Time

µs

Excludes system level

overhead (Note 5)

Word Programming Time

150

µs

Chip Programming Time

(Note 3)

Byte Mode

160

Word Mode

120

Parameter Symbol

Parameter Description

Test Setup

Package

Typ

Max

Unit

CIN

Input Capacitance

VIN = 0

TSOP

BGA

4.2

5.0

COUT

Output Capacitance

VOUT = 0

TSOP

4.5

5.5

BGA

5.4

6.5

CIN2

Control Pin Capacitance

VIN = 0

TSOP

6.5

BGA

3.9

4.7

CIN3

WP# Pin Capacitance

VIN = 0

TSOP

8.5

10.0

BGA

8.5

10.0

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