WM8788

Preliminary Technical Data

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PTD, December 2010, Rev 2.2

6

ELECTRICAL CHARACTERISTICS

Test Conditions

Implemented recommended calibration start-up sequence as detailed in Calibrated Start-Up section.

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Analogue Inputs (INL, INR)

Maximum input signal

level

Ω

AVDD/3.3

Vrms

Input capacitance

20

pF

ADC Input Path Performance (Analogue Input to ADC)

Signal to Noise Ratio

SNR

A-weighted, fs = 48kHz

106

dB

Unweighted, fs = 48kHz

103

A-weighted, fs = 96kHz

106

Unweighted, fs = 96kHz

103

Total Harmonic

Distortion

THD

-1dBFS input, Master Mode

-91

dB

-1dBFS input, Slave Mode

-88

Dynamic range

-60dBFS input

106

dB

Channel separation

20Hz to 20kHz

100

dB

Channel level matching

0.1

dB

Channel phase deviation

0.1

degree

Power Supply Rejection

Ratio (with respect to

AVDD)

PSRR

1kHz 100mV pk-pk applied to

AVDD

50

dB

Digital Inputs / Outputs

Input high level

0.7 x AVDD

V

Input low level

0.3 x AVDD

V

Output high level

0.9 x AVDD

V

Output low level

0.1 x AVDD

V

Input capacitance

5

pF

Input leakage

-1

1

μA

Clocking

MCLK frequency

2.048

36.864

MHz

Analogue Reference Levels

Midrail Reference

Voltage

VMID

-4%

AVDD/2

+4%

V

VMID resistance to

Ground

35

k

Ω

Current Consumption

AVDD current

consumption

Quiescent

fs = 48kHz, MCLK = 256fs

84

mA

Quiescent

fs = 96kHz, MCLK = 256fs

88

Quiescent

No clocks applied

1