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OPA188AIDBVT Datasheet(PDF) 5 Page - Texas Instruments

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Part # OPA188AIDBVT
Description  Precision, Low-Noise, Rail-to-Rail Output,36-V, Zero-Drift Operational Amplifiers
PDF  33 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

OPA188AIDBVT Datasheet(HTML) 5 Page - Texas Instruments

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OPA188
www.ti.com
SBOS642A – MARCH 2013 – REVISED MARCH 2013
ELECTRICAL CHARACTERISTICS:
Low-Voltage Operation, VS = ±2 V to < ±4 V (VS = +4 V to < +8 V)
At TA = +25°C, RL = 10 kΩ connected to VS / 2
(1), and V
CM = VOUT = VS / 2
(1), unless otherwise noted.
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNIT
OFFSET VOLTAGE
±6
±25
μV
VOS
Input offset voltage
TA = –40°C to +125°C
±0.03
±0.085
μV/°C
VS = 4 V to 36 V,
PSRR
Power-supply rejection ratio
0.075
0.3
μV/V
TA = –40°C to +125°C
Long-term stability(2)
4
μV
INPUT BIAS CURRENT
±160
±1400
pA
IB
Input bias current
TA = –40°C to +125°C
±8
nA
±320
±2800
pA
IOS
Input offset current
TA = –40°C to +125°C
±4
nA
NOISE
f = 0.1 Hz to 10 Hz
250
nVPP
en
Input voltage noise
f = 0.1 Hz to 10 Hz
40
nVrms
Input voltage noise density
f = 1 kHz
8.8
nV/
√Hz
in
Input current noise density
f = 1 kHz
7
fA/
√Hz
INPUT VOLTAGE RANGE
VCM
Common-mode voltage range
TA = –40°C to +125°C
V–
(V+) – 1.5
V
(V–) < VCM < (V+) – 1.5 V
106
114
dB
(V–) + 0.5 V < VCM < (V+) – 1.5 V,
114
120
dB
CMRR
Common-mode rejection ratio
VS = ±2 V
(V–) + 0.5 V < VCM < (V+) – 1.5 V,
110
120
dB
VS = ±2 V, TA = –40°C to +125°C
INPUT IMPEDANCE
ZID
Differential
100 || 6
M
Ω || pF
ZIC
Common-mode
6 || 9.5
1012
Ω || pF
OPEN-LOOP GAIN
(V–) + 0.5 V < VO < (V+) – 0.5 V,
110
120
dB
RL = 5 kΩ
AOL
Open-loop voltage gain
(V–) + 0.5 V < VO < (V+) – 0.5 V
120
130
dB
(V–) + 0.5 V < VO < (V+) – 0.5 V,
110
120
dB
TA = –40°C to +125°C
FREQUENCY RESPONSE
GBW
Gain-bandwidth product
2
MHz
SR
Slew rate
G = +1
0.8
V/
μs
tOR
Overload recovery time
VIN × G = VS
1
μs
THD+N
Total harmonic distortion + noise
1 kHz, G = 1, VOUT = 1 Vrms
0.0001%
(1)
VS / 2 = midsupply.
(2)
1000-hour life test at +125°C demonstrated randomly distributed variation in the range of measurement limits—approximately 4
μV.
Copyright © 2013, Texas Instruments Incorporated
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