OPA188

SBOS642A – MARCH 2013 – REVISED MARCH 2013

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PRODUCT

PACKAGE-LEAD

PACKAGE DESIGNATOR

SPECIFIED TEMPERATURE RANGE

SOT23-5

DBV

–40°C to +125°C

OPA188

SO-8

D

–40°C to +125°C

MSOP-8

DGK

–40°C to +125°C

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the

device product folder at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

VALUE

UNIT

Supply voltage

±20, 40 (single supply)

V

Voltage

(V–) – 0.5 to (V+) + 0.5

V

Current

±10

mA

Differential

±0.7

V

Continuous

–55 to +150

°C

Temperature range

–65 to +150

°C

+150

°C

Human body model (HBM)

1.5

kV

Electrostatic discharge (ESD) ratings

Charged device model (CDM)

1

kV

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and do not imply functional operation of the device at these or any other conditions beyond those indicated. Exposure to absolute-

maximum-rated conditions for extended periods may affect device reliability.

(2)

Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5 V beyond the supply rails should

be current-limited to 10 mA or less.

(3)

Short-circuit to ground, V-, or V+.

(4)

2

Submit Documentation Feedback

Copyright © 2013, Texas Instruments Incorporated

Product Folder Links: OPA188