RB520CS30L

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© NXP B.V. 2011. All rights reserved.

Product data sheet

Rev. 1 — 10 March 2011

8 of 14

NXP Semiconductors

RB520CS30L

8.

Test information

The current ratings for the typical waveforms as shown in Figure 9, 10 and 11 are

calculated according to the equations:

at DC, and

8.1 Quality information

This product has been qualified in accordance with the Automotive Electronics Council

(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is

suitable for use in automotive applications.

(1)

δ =1; DC

(2)

δ = 0.5; f = 20 kHz

(3)

δ = 0.2; f = 20 kHz

(4)

δ = 0.1; f = 20 kHz

Fig 11. Average forward current as a function of solder point temperature; typical values

0

50

100

150

175

125

75

25

006aac543

0.05

0.10

0.15

(A)

0.00

(1)

(2)

(3)

(4)

Fig 12. Duty cycle definition

P

t

006aaa812

duty cycle

δ =

I

FAV

()

I

M

δ

×

=

I

RMS

I

FAV

()

=

I

RMS

I

M

δ

×

=