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DSPIC33FJ32GP302TH/SP Datasheet(PDF) 331 Page - Microchip Technology |
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DSPIC33FJ32GP302TH/SP Datasheet(HTML) 331 Page - Microchip Technology |
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331 / 403 page  2009 Microchip Technology Inc. Preliminary DS70292D-page 331 dsPIC33FJ32GP302/304, dsPIC33FJ64GPX02/X04, AND dsPIC33FJ128GPX02/X04 FIGURE 30-2: EXTERNAL CLOCK TIMING Q1 Q2 Q3 Q4 OSC1 CLKO Q1 Q2 Q3 Q4 OS20 OS25 OS30 OS30 OS40 OS41 OS31 OS31 TABLE 30-16: EXTERNAL CLOCK TIMING REQUIREMENTS AC CHARACTERISTICS Standard Operating Conditions: 3.0V to 3.6V (unless otherwise stated) Operating temperature -40°C TA +85°C for Industrial -40°C TA +125°C for Extended Param No. Symbol Characteristic Min Typ(1) Max Units Conditions OS10 FIN External CLKI Frequency (External clocks allowed only in EC and ECPLL modes) DC — 40 MHz EC Oscillator Crystal Frequency 3.5 10 — — — 10 40 33 MHz MHz kHz XT HS SOSC OS20 TOSC TOSC = 1/FOSC 12.5 — DC ns OS25 TCY Instruction Cycle Time(2) 25 — DC ns OS30 TosL, TosH External Clock in (OSC1) High or Low Time 0.375 x TOSC — 0.625 x TOSC ns EC OS31 TosR, TosF External Clock in (OSC1) Rise or Fall Time — — 20 ns EC OS40 TckR CLKO Rise Time(3) —5.2 — ns — OS41 TckF CLKO Fall Time(3) —5.2 — ns — OS42 GM External Oscillator Transconductance(4) 14 16 18 mA/V VDD = 3.3V TA = +25ºC Note 1: Data in “Typ” column is at 3.3V, 25°C unless otherwise stated. 2: Instruction cycle period (TCY) equals two times the input oscillator time-base period. All specified values are based on characterization data for that particular oscillator type under standard operating conditions with the device executing code. Exceeding these specified limits may result in an unstable oscillator operation and/or higher than expected current consumption. All devices are tested to operate at “min.” values with an external clock applied to the OSC1/CLKI pin. When an external clock input is used, the “max.” cycle time limit is “DC” (no clock) for all devices. 3: Measurements are taken in EC mode. The CLKO signal is measured on the OSC2 pin. 4: Data for this parameter is Preliminary. This parameter is characterized, but not tested in manufacturing. |
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