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DA28F016SV-080 Datasheet(PDF) 27 Page - Intel Corporation

Part # DA28F016SV-080
Description  16-MBIT (1 MBIT x 16, 2 MBIT x 8) FlashFile MEMORY
PDF  63 Pages
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Manufacturer  INTEL [Intel Corporation]
Direct Link  http://www.intel.com
Logo INTEL - Intel Corporation

DA28F016SV-080 Datasheet(HTML) 27 Page - Intel Corporation

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28F016SV FlashFile™ MEMORY
27
TEST POINTS
INPUT
OUTPUT
2.0
0.8
0.8
2.0
2.4
0.45
AC test inputs are driven at V
OH (2.4 VTTL) for a Logic “1” and VOL (0.45 VTTL) for a Logic “0.” Input timing begins at VIH
(2.0 VTTL) and V
IL (0.8 VTTL). Output timing ends at VIH and VIL. Input rise and fall times (10% to 90%) <10 ns.
0528_07
Figure 7. Transient Input/Output Reference Waveform for
VCC = 5V ± 10% (Standard Testing Configuration)(1)
TEST POINTS
INPUT
OUTPUT
1.5
3.0
0.0
1.5
AC test inputs are driven at 3.0V for a Logic “1” and 0.0V for a Logic “0.” Input timing begins, and output timing ends, at 1.5V.
Input rise and fall times (10% to 90%) <10 ns.
0528_08
Figure 8. Transient Input/Output Reference Waveform for VCC = 3.3V ± 0.3V
and VCC = 5V ± 5% (High Speed Testing Configuration)(2)
NOTES:
1. Testing characteristics for 28F016SV-070 (Standard Testing Configuration) and 28F016SV-080.
2. Testing characteristics for 28F016SV-065/28F016SV-075 and 28F016SV-70 (High Speed Testing Configuration)/
28F016SV-120.



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