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AD5060 Datasheet(PDF) 14 Page - Analog Devices |
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AD5060 Datasheet(HTML) 14 Page - Analog Devices |
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14 / 24 page ![]() AD5040/AD5060 Rev. A | Page 14 of 24 TERMINOLOGY Relative Accuracy For the DAC, relative accuracy or integral nonlinearity (INL) is a measure of the maximum deviation, in LSBs, from a straight line passing through the endpoints of the DAC transfer function. A typical AD5060 INL vs. code plot is shown in Figure 4. Differential Nonlinearity (DNL) Differential nonlinearity is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of ±1 LSB maximum ensures monotonicity. This DAC is guaranteed monotonic by design. A typical AD5060 DNL vs. code plot is shown in Figure 5. Offset Error Offset error is a measure of the output error when zero code (0x0000) is loaded to the DAC register. Ideally, the output should be 0 V. The zero-code error is always positive in the AD5040/AD5060 because the output of the DAC cannot go below 0 V. This is due to a combination of the offset errors in the DAC and output amplifier. Zero-code error is expressed in mV. Full-Scale Error Full-scale error is a measure of the output error when full-scale code (0xFFFF AD5060, 0x3FFF AD5040) is loaded to the DAC register. Ideally, the output should be VDD − 1 LSB. Full-scale error is expressed in percent of full-scale range. Gain Error This is a measure of the span error of the DAC. It is the devia- tion in slope of the DAC transfer characteristic from ideal, expressed as a percent of the full-scale range. Total Unadjusted Error (TUE) Total unadjusted error is a measure of the output error taking all the various errors into account. A typical AD5060 TUE vs. code plot is shown in Figure 6. Offset Error Drift This is a measure of the change in zero-code error with a change in temperature. It is expressed in μV/°C. Gain Error Drift This is a measure of the change in gain error with changes in temperature. It is expressed in (ppm of full-scale range)/°C. Digital-to-Analog Glitch Impulse Digital-to-analog glitch impulse is the impulse injected into the analog output when the input code in the DAC register changes state. It is normally specified as the area of the glitch in nV-s and is measured when the digital input code is changed by 1 LSB at the worst case code 53786; see Figure 23 and Figure 24. The expanded view in Figure 23 shows the glitch generated following completion of the calibration routine; Figure 24 zooms in on this glitch. Digital Feedthrough Digital feedthrough is a measure of the impulse injected into the analog output of the DAC from the digital inputs of the DAC, but is measured when the DAC output is not updated. It is specified in nV-s and measured with a full-scale code change on the data bus—that is, from all 0s to all 1s, and vice versa. |
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