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ISL6142CB Datasheet(PDF) 4 Page - Intersil Corporation |
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ISL6142CB Datasheet(HTML) 4 Page - Intersil Corporation |
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4 / 23 page ![]() 4 Pin Descriptions PWRGD (ISL6142; L Version) Pin 1 - This digital output is an open-drain pull-down device and can be used to directly enable an external module. During start-up the DRAIN and GATE voltages are monitored with two separate comparators. The first comparator looks at the DRAIN pin voltage compared to the internal VPG reference (1.3V); this measures the voltage drop across the external FET and sense resistor. When the DRAIN to VEE voltage drop is less than 1.3V, the first of two conditions required for the power to be considered good are met. In addition, the GATE voltage monitored by the second comparator must be within approximately 2.5V of its normal operating voltage (13.6V). When both criteria are met the PWRGD output will transition low and be latched in the active state, enabling the external module. When this occurs the two comparators discussed above no longer control the output. However a third comparator continues to monitor the DRAIN voltage, and will drive the PWRGD output inactive if the DRAIN voltage raises more than 8V above VEE. In addition, any of the signals that shut off the GATE (Over- Voltage, Under-Voltage, Under-Voltage Lock-Out, Over- Current time-out, pulling the DIS pin high, or powering down) will reset the latch and drive the PWRGD output high to disable the module. In this case, the output pull-down device shuts off, and the pin becomes high impedance. Typically an external pull-up of some kind is used to pull the pin high (many brick regulators have a pull-up function built in). PWRGD (ISL6152; H Version) Pin 1 - This digital output is used to provide an active high signal to enable an external module. The Power Good comparators are the same as described above, but the active state of the output is reversed (reference figure 37). When power is considered good (both DRAIN and GATE are normal) the output is latched in the active high state, the DMOS device (Q3) turns on and sinks current to VEE through a 6.2K Ω resistor. The base of Q2 is clamped to V EE to turn it off. If the external pull-up current is high enough (>1mA, for example), the voltage drop across the resistor will be large enough to produce a logic high output and enable the external module (in this example, 1mA x 6.2K Ω = 6.2V). Note that for all H versions, although this is a digital pin functionally, the logic high level is determined by the external pull-up device, and the power supply to which it is connected; the IC will not clamp it below the VDD voltage. Therefore, if the external device does not have its own clamp, or if it would be damaged by a high voltage, an external clamp might be necessary. If the power good latch is reset (GATE turns off), the internal DMOS device (Q3) is turned off, and Q2 (NPN) turns on to clamp the output one diode drop above the DRAIN voltage to produce a logic low, indicating power is no longer good. FAULT Pin 2- This digital output is an open-drain, pull-down device, referenced to VEE. It is pulled active low whenever the Over-Current latch is set. It goes to a high impedance state when the fault latch is reset by toggling the UV or DIS pins. An external pull-up resistor to a logic supply (5V or less) is required; the fault outputs of multiple IC’s can be wire-OR’d together. If the pin is not used it should be left open. DIS Pin 3 - This digital input disables the FET when driven to a logic high state. It has a weak internal pull-up device to an internal 5V rail (10 µA), so an open pin will also act as a logic high. The input has a nominal trip point of 1.6 V while rising, and a hysteresis of 1.0V. The threshold voltage is referenced to VEE, and is compatible with CMOS logic levels. A logic low will allow the GATE to turn on (assuming the 4 other conditions described in the GATE section are also true). The DIS pin can also be used to reset the Over-Current latch when toggled high to low. If not used the pin should be tied to the negative supply rail (-VIN). OV (Over-Voltage) Pin 4 - This analog input compares the voltage on the pin to an internal voltage reference of 1.255 V (nominal). When the input goes above the reference the GATE pin is immediately pulled low to shut off the external FET. The built in 25mV hysteresis will keep the GATE off until the OV pin drops below 1.230V (the nominal high to low threshold). A typical application will use an external resistor divider from VDD to -VIN to set the OV trip level. A three- resistor divider can be used to set both OV and UV trip points to reduce component count. UV (Under-Voltage) Pin 5 - This analog input compares the voltage on the pin to an internal comparator with a built in hysteresis of 135mv. When the UV input goes below the nominal reference voltage of 1.120V, the GATE pin is immediately pulled low to shut off the external FET. The GATE will remain off until the UV pin rises above a 1.255V low to high threshold. A typical application will use an external resistor divider from VDD to -VIN to set the UV level as desired. A three-resistor divider can be used to set both OV and UV trip points to reduce component count. The UV pin is also used to reset the Over-Current latch. The pin must be cycled below 1.120V (nominal) and then above 1.255V (nominal) to clear the latch and initiate a normal start-up sequence. IS- Pin 6 - This analog pin is the negative input of the current sense circuit. A sensing resistor (R7) is connected between this pin and the VEE side of resistor R1. The ratio of R1/R7 defines the ISENSE to ISOUT current scaling factor. If current sensing is not used in the application, the IS- pin should be tied directly to the IS+ pin and the node should be left floating. ISL6142, ISL6152 |
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