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AN3401 Datasheet(PDF) 8 Page - STMicroelectronics |
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AN3401 Datasheet(HTML) 8 Page - STMicroelectronics |
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8 / 18 page ![]() Thermal runaway AN3401 8/18 Doc ID 018842 Rev 1 Experimental results can confirm that: The stability can be guaranteed only if P_forward > P_reverse @ t_change In Figure 7 the details for the temperature increase that destroys the device is shown . Figure 7. Thermal runaway detail °C 50 100 150 200 Canale 5 Canale 6 Canale 7 Canale 8 17000 17200 17400 17600 17800 Sec Diode in forward during the shadow Diode in reverse with cells fully sunned Diode Break event due to the thermal runaway |
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