AN3181 datasheet(25/31 Pages) STMICROELECTRONICS

Part #	AN3181

Description	Guidelines for obtaining IEC 60335 Class B certification in an STM8 application

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Manufacturer	STMICROELECTRONICS [STMicroelectronics]

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AN3181

Class B solution structure

Doc ID 17286 Rev 2

25/31

inside this range in both cases. This area differs among the devices. The user must respect

the dedicated stack area when the pattern location is changed.

Figure 14.

Stack overflow run mode test structure

4.4.4

Clock run mode self test

The current master clock frequency selected by user application is gated by LSI internal

clock source. The resulting number of pulses is compared with the initial master frequency

reference sample measure which was stored during initial run mode self tests. When there

is more than +/-25% difference found, FailSafe() routine is called. Occasional over captured

measure is ignored. It can appear when a longer user interrupt service corrupts current

measurement.

Figure 15.

Clock run mode self test structure

AN3181 Datasheet(PDF) 25 Page - STMicroelectronics