AN3307 datasheet(26/37 Pages) STMICROELECTRONICS

Part #	AN3307

Description	Guidelines for obtaining IEC 60335 Class B certification for any STM32 application

PDF	37 Pages

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Manufacturer	STMICROELECTRONICS [STMicroelectronics]

Direct Link	http://www.st.com

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26 / 37 page

Class B solution structure

AN3307

26/37

Doc ID 18186 Rev 4

The algorithm of the entire test and a detailed description one of its scramble loops is given

in Figure 10 and Figure 11. If an error is detected, the test is interrupted and a fail result is

returned. The simplified March X algorithm can also be used. It is faster, as two middle

marching steps are skipped.

Figure 10.

RAM startup self-test structure

Figure 11.

Scramble test - detailed structure of a single check and fill procedure

MS18597V1

Fill RAM with 0

Scramble test (check ~0 / fill 0)

Test OK

Fail Safe routine

Fail

Check RAM for 0

Fail

Increasing order

of addresses

Decreasing order

of addresses

Removed in

March X test

Scramble test (check ~0 / fill 0)

MS18598V1

End of

scramble

pattern ?

Fault

Check last value

Init scramble pointer

Init RAM pointer

End of RAM ?

Fail

Yes

Next RAM block

Fill new value

++ scramble pointer

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