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KAI-08050 Datasheet(PDF) 14 Page - ON Semiconductor |
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KAI-08050 Datasheet(HTML) 14 Page - ON Semiconductor |
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14 / 31 page ![]() KAI−08050 www.onsemi.com 14 Table 11. OPERATION CONDITIONS FOR DEFECT TESTING AT 275C Description Condition Notes Operational Mode Two outputs, using VOUTa and VOUTc, continuous readout HCCD Clock Frequency 20 MHz Pixels Per Line 3520 1 Lines Per Frame 1360 2 Line Time 177.8 msec Frame Time 241.8 msec Photodiode Integration Time (PD_Tint) Mode A: PD_Tint = Frame Time = 241.8 msec, no electronic shutter used Mode B: PD_Tint = 33 msec, electronic shutter used VCCD Integration Time 224.0 msec 3 Temperature 27°C Light Source Continuous red, green and blue LED illumination 4 Operation Nominal operating voltages and timing 1. Horizontal overclocking used. 2. Vertical overclocking used. 3. VCCD Integration Time = 1260 lines x Line Time, which is the total time a pixel will spend in the VCCD registers. 4. For monochrome sensor, only the green LED is used. Table 12. DEFECT DEFINITIONS FOR TESTING AT 275C Description Definition Standard Grade Grade 2 Notes Major dark field defective bright pixel PD_Tint = Mode A → Defect ≥ 26 mV or PD_Tint = Mode B → Defect ≥ 4 mV 80 80 1 Major bright field defective dark pixel Defect ≥ 12% Cluster defect A group of 2 to 10 contiguous major defective pixels, but no more than 3 adjacent defects horizontally. 15 n/a 2 Cluster defect (grade 2) A group of 2 to 10 contiguous major defective pixels n/a 15 2 Column defect A group of more than 10 contiguous major defective pixels along a single column 0 0 2 1. For the color device (KAI−08050−CBA or KAI−08050−PBA), a bright field defective pixel deviates by 12% with respect to pixels of the same color. 2. Column and cluster defects are separated by no less than two (2) good pixels in any direction (excluding single pixel defects). Defect Map The defect map supplied with each sensor is based upon testing at an ambient (27 °C) temperature. Minor point defects are not included in the defect map. All defective pixels are reference to pixel 1, 1 in the defect maps. See Figure 13: Regions of interest for the location of pixel 1,1. |
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