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KAI-08050 Datasheet(PDF) 14 Page - ON Semiconductor

Part # KAI-08050
Description  Interline CCD Image Sensor
PDF  31 Pages
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

KAI-08050 Datasheet(HTML) 14 Page - ON Semiconductor

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KAI−08050
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Table 11. OPERATION CONDITIONS FOR DEFECT TESTING AT 275C
Description
Condition
Notes
Operational Mode
Two outputs, using VOUTa and VOUTc, continuous readout
HCCD Clock Frequency
20 MHz
Pixels Per Line
3520
1
Lines Per Frame
1360
2
Line Time
177.8 msec
Frame Time
241.8 msec
Photodiode Integration Time
(PD_Tint)
Mode A: PD_Tint = Frame Time = 241.8 msec, no electronic shutter used
Mode B: PD_Tint = 33 msec, electronic shutter used
VCCD Integration Time
224.0 msec
3
Temperature
27°C
Light Source
Continuous red, green and blue LED illumination
4
Operation
Nominal operating voltages and timing
1. Horizontal overclocking used.
2. Vertical overclocking used.
3. VCCD Integration Time = 1260 lines x Line Time, which is the total time a pixel will spend in the VCCD registers.
4. For monochrome sensor, only the green LED is used.
Table 12. DEFECT DEFINITIONS FOR TESTING AT 275C
Description
Definition
Standard Grade
Grade 2
Notes
Major dark field defective bright pixel
PD_Tint = Mode A → Defect ≥ 26 mV
or
PD_Tint = Mode B → Defect ≥ 4 mV
80
80
1
Major bright field defective dark pixel
Defect ≥ 12%
Cluster defect
A group of 2 to 10 contiguous major defective
pixels, but no more than 3 adjacent defects
horizontally.
15
n/a
2
Cluster defect (grade 2)
A group of 2 to 10 contiguous major defective
pixels
n/a
15
2
Column defect
A group of more than 10 contiguous major
defective pixels along a single column
0
0
2
1. For the color device (KAI−08050−CBA or KAI−08050−PBA), a bright field defective pixel deviates by 12% with respect to pixels of the same
color.
2. Column and cluster defects are separated by no less than two (2) good pixels in any direction (excluding single pixel defects).
Defect Map
The defect map supplied with each sensor is based upon
testing at an ambient (27
°C) temperature. Minor point
defects are not included in the defect map. All defective
pixels are reference to pixel 1, 1 in the defect maps. See
Figure 13: Regions of interest for the location of pixel 1,1.



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