LM7322MASLASHNOPB datasheet(8/39 Pages) TI1

8 / 39 page

LM7321, LM7322

SNOSAW8E – MAY 2008 – REVISED SEPTEMBER 2015

www.ti.com

±5-V Electrical Characteristics (continued)

Unless otherwise specified, all limited ensured for TA = 25°C, V

+ = 5 V, V− = −5V, V

CM = 0 V, VOUT = 0 V, and RL > 1 MΩ to 0

(1)

PARAMETER

TEST CONDITION

MIN(2)

TYP(3)

MAX(2)

UNIT

1.0

1.3

LM7321

TA = –40°C to

+125°C

Supply Current

VCM = −4.5 V

2.3

2.8

LM7322

TA = –40°C to

3.8

+125°C

Slew Rate(7)

AV = +1, VI = 8-V Step

12.3

V/µs

Unity Gain Frequency

RL = 2 kΩ, CL = 20 pF

MHz

GBW

Gain Bandwidth

f = 50 kHz

MHz

Input Referred Voltage

f = 2 kHz

14.3

nV/

√H

Noise Density

Input Referred Current

f = 2 kHz

1.35

pA/

√H

Noise Density

Total Harmonic

f = 1 kHz, RL = 100 kΩ, AV = +2

THD+N

−79

Distortion + Noise

VOUT = 8 VPP

CT Rej.

Crosstalk Rejection

f = 100 kHz, Driver RL = 10 kΩ

(7)

Slew rate is the slower of the rising and falling slew rates. Connected as a Voltage Follower.

7.7

±15-V Electrical Characteristics

Unless otherwise specified, all limited ensured for TA = 25°C, V

+ = 15 V, V− = −15 V, V

CM = 0 V, VOUT = 0 V, and RL > 1 MΩ to

15 V.

(1)

PARAMETER

TEST CONDITION

MIN(2)

TYP(3)

MAX(2)

UNIT

−6

±0.7

VCM = −14.5 V and

VOS

Input Offset Voltage

VCM = 14.5 V

–40°C to +125°C

−8

Input Offset Voltage

TC VOS

VCM = −14.5 V and VCM = 14.5 V

(4)

±2

µV/°C

Temperature Drift

−2

−1.1

VCM = −14.5 V

(5)

–40°C to +125°C

−2.5

Input Bias Current

µA

0.45

VCM = 14.5 V

(5)

–40°C to +125°C

1.5

300

VCM = −14.5 V and

IOS

Input Offset Current

VCM = 14.5 V

–40°C to +125°C

500

100

−15 V ≤ VCM ≤ 12 V

–40°C to +125°C

Common-Mode Rejection

CMRR

Ratio

−15 V ≤ VCM ≤ 15 V

–40°C to +125°C

100

Power Supply Rejection

2.7 V

≤ VS ≤ 30 V, VCM

PSRR

Ratio

−14.5 V

–40°C to +125°C

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical

tables under conditions of internal self-heating where TJ > TA.

(2)

All limits are ensured by testing or statistical analysis.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

(4)

Offset voltage temperature drift determined by dividing the change in VOS at temperature extremes into the total temperature change.

(5)

Positive current corresponds to current flowing into the device.

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