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LIS3DE Datasheet(PDF) 10 Page - STMicroelectronics

Part # LIS3DE
Description  ultra-low-power high-performance 3-axis "nano" accelerometer
PDF  46 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

LIS3DE Datasheet(HTML) 10 Page - STMicroelectronics

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Mechanical and electrical specifications
LIS3DE
10/46
DocID023719 Rev 3
2
Mechanical and electrical specifications
2.1
Mechanical characteristics
Vdd = 2.5 V, T = 25 °C unless otherwise noted(a).
a. The product is factory calibrated at 2.5 V. The operational power supply range is from 1.71 V to 3.6 V.
Table 3. Mechanical characteristics
Symbol
Parameter
Test conditions
Min.
Typ.(1)
Max.
Unit
FS
Measurement range(2)
FS bit set to 00
±2.0
g
FS bit set to 01
±4.0
FS bit set to 10
±8.0
FS bit set to 11
±16.0
So
Sensitivity
FS bit set to 00
15.6
mg/digit
FS bit set to 01
31.2
mg/digit
FS bit set to 10
62.5
mg/digit
FS bit set to 11
187.5
mg/digit
TCSo
Sensitivity change vs.
temperature
FS bit set to 00
±0.05
%/°C
TyOff
Typical zero-g level
offset accuracy(3)(4)
FS bit set to 00
±100
mg
TCOff
Zero-g level change
vs. temperature
Max. delta from 25 °C
±0.8
mg/°C
Vst
Self-test
output change(5)(6)(7)
FS bit set to 00
X-axis
50
1800
mg
FS bit set to 00
Y-axis
50
1800
mg
FS bit set to 00
Z-axis
50
1800
mg
Top
Operating
temperature range
-40
+85
°C
1. Typical specifications are not guaranteed.
2. Verified by wafer level test and measurement of initial offset and sensitivity.
3. Typical zero-g level offset value after MSL3 preconditioning.
4. Offset can be eliminated by enabling the built-in high-pass filter.
5. The sign of the “self-test output change” is defined by CTRL_REG4 ST sign bits, for all axes.
6. The “self-test output change” is defined as the absolute value of:
OUTPUT[LSB](CTRL_REG4 ST1, ST0 bits=01) - OUTPUT[LSB](CTRL_REG4 ST1, ST0 bits=00)
7. Output data reaches 99% of final value after 1ms+1/ODR when enabling the self-test mode, due to device filtering.



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