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RHFLVDS32A Datasheet(PDF) 8 Page - STMicroelectronics

Part # RHFLVDS32A
Description  Rad-hard quad LVDS receivers
PDF  15 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

RHFLVDS32A Datasheet(HTML) 8 Page - STMicroelectronics

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Electrical characteristics
RHFLVDS32A
8/15
DocID025371 Rev 3
Cold sparing
The RHFLVDS32A features a cold spare input and output buffer. In high reliability
applications, cold sparing enables a redundant device to be tied to the data bus with its
power supply at 0 V (VCC = GND) without affecting the bus signals or injecting current from
the I/Os to the power supplies. Cold sparing also allows redundant devices to be kept
powered off so that they can be switched on only when required. This has no impact on the
application. Cold sparing is achieved by implementing a high impedance between the I/Os
and VCC. The ESD protection is ensured through a non-conventional dedicated structure.
Fail-safe
In many applications, inputs need a fail-safe function to avoid an uncertain output state
when the inputs are not connected properly. In case of an LVDS input short circuit or floating
inputs, the TTL outputs remain in stable logic-high state.
tPHLD
Propagation delay time, high to
low output
VID = 200 mVp-p, input pulse
from 1.1 V to 1.3 V, VCM = 1.2 V
Load: refer to Figure 3
12.5
ns
tPLHD
Propagation delay time, low to
high output
12.5
tSK1
Channel to channel skew(3)
VID = 200 mVp-p
Load: refer to Figure 3
0.25
ns
tSK2
Chip to chip skew(4)(5)
0.7
tSKD
Differential skew(6)
(tPHLD-tPLHD)
0.3
t r
Output signal rise time
Load: refer to Figure 3
0.9
t f
Output signal fall time
0.9
tPLZ
Propagation delay time, low
level to high impedance output
Load: refer to Figure 4
3.8
tPHZ
Propagation delay time, high
level to high impedance output
3.8
tPZH
Propagation delay time, high
impedance to high level output
3.8
tPZL
Propagation delay time, high
impedance to low level output
3.8
tD1
Fail-safe to active time
1
µs
tD2
Active to fail-safe time
1
1. All pins except pin under test and VCC are floating.
2. Guaranteed by characterization on the bench.
3. tSK1 is the maximum delay time difference between all outputs of the same device (measured with all inputs connected
together).
4. tSK2 is the maximum delay time difference between outputs of all devices when they operate with the same supply voltage,
at the same temperature.
5. Guaranteed by design. tSKD is the maximum delay time difference between tPHLD-tPLHD
6. tSKD is the maximum delay time difference between tPHLD and tPLHD, see Figure 3.
Table 7. Electrical characteristics (continued)
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit



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