SCANSTA111MTSLASHNOPB datasheet(4/38 Pages) TI1

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SCANSTA111

SNLS060K – AUGUST 2001 – REVISED APRIL 2013

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PIN DESCRIPTIONS

No.

Pin Name

Pins

I/O

Description

VCC

N/A

Power

GND

N/A

Ground

TMSB

BACKPLANE TEST MODE SELECT: Controls sequencing through the TAP Controller of the

'STA111. Also controls sequencing of the TAPs which are on the local scan chains. This input has a

25K

Ω pull-up resistor and no ESD clamp diode (ESD is controlled with an alternate method). When

the device is power-off (VDD floating), this input appears to be a capacitive load to ground

(1). When

VDD = 0V (i.e.; not floating but tied to VSS) this input appears to be a capacitive load with the pull-up

to ground.

TDIB

BACKPLANE TEST DATA INPUT: All backplane scan data is supplied to the 'STA111 through this

input pin. This input has a 25K

Ω pull-up resistor and no ESD clamp diode (ESD is controlled with an

alternate method). When the device is power-off (VDD floating), this input appears to be a capacitive

load to ground(1). When VDD = 0V (i.e.; not floating but tied to VSS) this input appears to be a

capacitive load with the pull-up to ground.

TDOB

BACKPLANE TEST DATA OUTPUT: This output drives test data from the 'STA111 and the local

TAPs, back toward the scan master controller. This output has 24mA of drive current. When the

device is power-off (VDD = 0V or floating), this output appears to be a capacitive load

(1).

TCKB

TEST CLOCK INPUT FROM THE BACKPLANE: This is the master clock signal that controls all

scan operations of the 'STA111 and of the local scan ports. This input has no pull-up resistor and no

ESD clamp diode (ESD is controlled with an alternate method). When the device is power-off (VDD

floating), this input appears to be a capacitive load to ground(2). When VDD = 0V (i.e.; not floating

but tied to VSS) this input appears to be a capacitive load to ground.

TRSTB

TEST RESET: An asynchronous reset signal (active low) which initializes the 'STA111 logic. This

input has a 25K

Ω pull-up resistor and no ESD clamp diode (ESD is controlled with an alternate

method). When the device is power-off (VDD floating), this input appears to be a capacitive load to

ground(2). When VDD = 0V (i.e.; not floating but tied to VSS) this input appears to be a capacitive

load with the pull-up to ground.

TRIST(B,0-2)

TRI-STATE NOTIFICATION OUTPUT: This signal is asserted high when the associated TDO is

TRI-STATEd. Associated means TRISTB is for TDOB, TRIST1 is for TDO1, etc. This output has

12mA of drive current.

BACKPLANE PASS-THROUGH INPUT: A general purpose input which is driven to the Yn of a

single selected LSP. (Not available when multiple LSPs are selected). This input has an internal

pull-up resistor.

BACKPLANE PASS-THROUGH OUTPUT: A general purpose output which is driven from the An of

a single selected LSP. (Not available when multiple LSPs are selected). This output has 24mA of

drive current.

S(0-6)

SLOT IDENTIFICATION: The configuration of these pins is used to identify (assign a unique

address to) each 'STA111 on the system backplane .

OUTPUT ENABLE for the Local Scan Ports, active low. When high, this active-low control signal

TRI-STATEs all local scan ports on the 'STA111, to enable an alternate resource to access one or

more of the three local scan chains.

TDO(0-2)

TEST DATA OUTPUTS: Individual output for each of the local scan ports . These outputs have

24mA of drive current.

TDI(0-2)

TEST DATA INPUTS: Individual scan data input for each of the local scan ports .

TMS(0-2)

TEST MODE SELECT OUTPUTS: Individual output for each of the local scan ports. TMSn does not

provide a pull-up resistor (which is assumed to be present on a connected TMS input, per the IEEE

1149.1 requirement) . These outputs have 24mA of drive current.

TCK(0-2)

LOCAL TEST CLOCK OUTPUTS: Individual output for each of the local scan ports. These are

buffered versions of TCKB . These outputs have 24mA of drive current.

TRST(0-2)

LOCAL TEST RESETS: A gated version of TRSTB . These outputs have 24mA of drive current.

A(0-1)

LOCAL PASS-THROUGH INPUTS: General purpose inputs which can be driven to the backplane

pin YB. (Only on LSP0 and LSP1. Only available when a single LSP is selected) . These inputs have

an internal pull-up resistor.

Y(0-1)

LOCAL PASS-THROUGH OUTPUT: General purpose outputs which can be driven from the

backplane pin AB. (Only on LSP0 and LSP1. Only available when a single LSP is selected) . These

outputs have 24mA of drive current.

(1)

Refer to the IBIS model on our website for I/O characteristics.

(2)

Refer to the IBIS model on our website for I/O characteristics.

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