TLC27M4CPWR datasheet(19/52 Pages) TI1

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(a) f = 1 kHz

(b) 1 kHz < f < BOM

(d) f > BOM

TLC27M4, TLC27M4A, TLC27M4B, TLC27M4Y, TLC27M9

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SLOS093D – OCTOBER 1987 – REVISED OCTOBER 2012

PARAMETER MEASUREMENT INFORMATION (continued)

Full-Power Response

Full-power response, the frequency above which the operational amplifier slew rate limits the output voltage

swing, is often specified two ways: full-linear response and full-peak response. The full-linear response is

generally measured by monitoring the distortion level of the output, while increasing the frequency of a sinusoidal

input signal until the maximum frequency is found above which the output contains significant distortion. The full-

peak response is defined as the maximum output frequency, without regard to distortion, above which full peak-

to-peak output swing cannot be maintained.

Because there is no industry-wide accepted value for significant distortion, the full-peak response is specified in

this data sheet and is measured using the circuit of Figure 1. The initial setup involves the use of a sinusoidal

input to determine the maximum peak-to-peak output of the device (the amplitude of the sinusoidal wave is

increased until clipping occurs). The sinusoidal wave is then replaced with a square wave of the same amplitude.

The frequency is then increased until the maximum peak-to-peak output can no longer be maintained (Figure 5).

A square wave is used to allow a more accurate determination of the point at which the maximum peak-to-peak

output is reached.

Figure 5. Full-Power-Response Output Signal

Test Time

Inadequate test time is a frequent problem, especially when testing CMOS devices in a high-volume, short-test-

time environment. Internal capacitances are inherently higher in CMOS than in bipolar and BiFET devices and

require longer test times than their bipolar and BiFET counterparts. The problem becomes more pronounced with

reduced supply levels and lower temperatures.

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TLC27M4CPWR Datasheet(PDF) 19 Page - Texas Instruments