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TLE8080EM Datasheet(PDF) 15 Page - Infineon Technologies AG |
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TLE8080EM Datasheet(HTML) 15 Page - Infineon Technologies AG |
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15 / 39 page ![]() TLE8080EM Power Stages Data Sheet 15 Rev. 1.1, 2012-10-19 In overcurrent condition the affected channel will be switched off. There are two different implementations for switching on again after an over current event. For channels 1, 3, 4 and 5 the switch off state is latched. The input pins IN1, IN3 must be set to low to reset the latch before the channel can be switched on again. For channels 4 and 5 the over current status is reset with a write command to the CMD register. The switching state is according to the status of bit 1 and 2. Channel 2 will be switched off and after t oc_off = 5ms typically the channel will be switched on again automatically. The result is repetitive switching with a fixed off time of t oc,off. The overcurrent status of channel 2 is internally latched. For releasing the over current diagnosis bit after over current condition, channel 2 must stay switched on for at least toc,St. The bits 0 to 4 in the Stat register reflect the actual switching status of the channels. For detailed description see Chapter 8.2.2. All the channels are protected from over temperature. In an overtemperature situation the affected channel will be switched off. The channel will restart operation if the junction temperature decreases by thermal shutdown hysteresis T OT,Hys. Channels 4 and 5 are using a common temperature sensor. Therefore, the two channels are switched together during over temperature. For channels 1, 3, 4 and 5 an open load/short to GND in off detection with a pull down current source (active in off) and a comparator is implemented. In case of switch off and the output voltage is below the open load detection threshold (Voutx < Vol,th), the open load in off timer is started. After the open load in off delay time tol,d , the open load is detected (timing see Figure 9 and Figure 10). The diagnosis status of the channels is monitored in the SPI Diagnosis Register DIAG (see Chapter 8.2). |
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