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LMX3161 Datasheet(PDF) 7 Page - National Semiconductor (TI) |
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LMX3161 Datasheet(HTML) 7 Page - National Semiconductor (TI) |
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7 / 14 page ![]() Electrical Characteristics (Continued) Note 13: The doubler section is tested at 1.89 GHz, and it is guaranteed by design to operate within 1.7 — 1.9 GHz range. Note 14: See Function Register Programming Description for Icpo description. Note 15: Tested in a 50 Ω environment. AC Timing Characteristics Serial Data Input Timing TEST CONDITIONS: The Serial Data Input Timing is tested using a symmetrical waveform around V CC/2. The test waveform has an skew rate of 0.6V/ns. Symbol Parameter Conditions Min Typ Max Unit MICROWIRE™ Interface t CS Data to Clock Set Up Time Refer to Test Condition. 50 — — ns t CH Data to Clock Hold Time Refer to Test Condition. 10 — — ns t CWH Clock Pulse Width High Refer to Test Condition. 50 — — ns t CWL Clock Pulse Width Low Refer to Test Condition. 50 — — ns t ES Clock to Load Enable Set Up Time Refer to Test Condition. 50 — — ns t EW Load Enable Pulse Width Refer to Test Condition. 50 — — ns DS012815-3 Notes: Parenthesis data indicates programmable reference divider data. Data shifted into register on clock rising edge. Data is shifted in MSB first. www.national.com 7 |
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