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STD4NK100Z Datasheet(PDF) 5 Page - STMicroelectronics

Part # STD4NK100Z
Description  Very low intrinsic capacitance
PDF  16 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STD4NK100Z Datasheet(HTML) 5 Page - STMicroelectronics

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DocID022821 Rev 2
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STD4NK100Z
Electrical characteristics
16
The built-in back-to-back Zener diodes have specifically been designed to enhance the
device's ESD capability. In this respect the Zener voltage is appropriate to achieve an
efficient and cost-effective intervention to protect the device's integrity. These integrated
Zener diodes thus avoid the usage of external components.
Table 7. Source drain diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
ISD
Source-drain current
-
2.2
A
ISDM
(1)
1.
Pulse width limited by safe operating area
Source-drain current (pulsed)
-
8.8
A
VSD
(2)
2.
Pulsed: pulse duration=300 µs, duty cycle 1.5%
Forward on voltage
ISD= 2.2 A, VGS=0
-
1.6
V
trr
Reverse recovery time
ISD= 2.5 A,
di/dt = 100 A/µs,
VDD=100 V
(see Figure 14)
-
584
ns
Qrr
Reverse recovery charge
-
2.3
µC
IRRM
Reverse recovery current
-
8
A
trr
Reverse recovery time
ISD= 2.5 A,
di/dt = 100 A/µs,
VDD=100 V, Tj=150 °C
(see Figure 14)
-
628
ns
Qrr
Reverse recovery charge
-
2.5
µC
IRRM
Reverse recovery current
-
8.1
A
Table 8. Gate-source Zener diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
V(BR)GSO Gate-source breakdown voltage Igs=± 1 mA, ID=0
30
-
V



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