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STM32L496QGI3STR Datasheet(PDF) 111 Page - STMicroelectronics |
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STM32L496QGI3STR Datasheet(HTML) 111 Page - STMicroelectronics |
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111 / 263 page ![]() DocID029173 Rev 2 111/263 STM32L496xx Electrical characteristics 236 6.1.7 Current consumption measurement Figure 19. Current consumption measurement scheme with and without external SMPS power supply The IDD_ALL parameters given in Table 26 to Table 48 represent the total MCU consumption including the current supplying VDD, VDDIO2, VDDA, VDDUSB and VBAT. 6.2 Absolute maximum ratings Stresses above the absolute maximum ratings listed in Table 19: Voltage characteristics, Table 20: Current characteristics and Table 21: Thermal characteristics may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these conditions is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. Exposure to maximum rating conditions for extended periods may affect device reliability. Device mission profile (application conditions) is compliant with JEDEC JESD47 qualification standard, extended mission profiles are available on demand. |
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