ACS770XCB datasheet(13/29 Pages) ALLEGRO

13 / 29 page

Thermally Enhanced, Fully Integrated, Hall-Effect-Based

High-Precision Linear Current Sensor IC with 100 µΩ Current Conductor

ACS770xCB

Allegro MicroSystems, LLC

115 Northeast Cutoff

Worcester, Massachusetts 01615-0036 U.S.A.

1.508.853.5000; www.allegromicro.com

X200U PERFORMANCE CHARACTERISTICS [1]: TOP = –40°C to 85°C, CBYP = 0.1 μF, VCC= 5 V, unless otherwise specified

Characteristic

Symbol

Test Conditions

Min.

Typ.

Max.

Unit

Primary Sampled Current

–

200

Sensitivity [2]

SensTA

Measured using full-scale IP, TA = 25°C

19.52

20.48

mV/A

Sens(TOP)HT Measured using full-scale IP, TOP = 25°C to 85°C

19.52

20.48

mV/A

Sens(TOP)LT Measured using full-scale IP, TOP = –40°C to 25°C

19.3

20.7

mV/A

Sensitivity Drift Over Lifetime [3] ΔSensLIFE

TOP = –40°C to 85°C, shift after AEC-Q100 grade 0

qualification testing

–0.36

±0.12

0.36

mV/A

Noise [4]

VNOISE

TA= 25°C, 10 nF on VIOUT pin to GND

–

Nonlinearity

ELIN

Measured using full-scale and half-scale IP

–1

–

Electrical Offset Voltage [5][6]

VOE(TA)

IP = 0 A, TA = 25°C

–10

±4

VOE(TOP)HT IP = 0 A, TOP = 25°C to 85°C

–10

±6

VOE(TOP)LT IP = 0 A, TOP = –40°C to 25°C

–20

±6

Electrical Offset Voltage Drift

Over Lifetime [3]

∆VOE(LIFE)

IP = 0 A, TOP = –40°C to 85°C, shift after AEC-Q100 grade 0

qualification testing

–5

±2

Magnetic Offset Error

IERROM

IP = 0 A, TA = 25°C, after excursion of 200 A

–

250

575

Total Output Error [7]

ETOT(TA)

Measured using full-scale IP, TA = 25°C

–2.4

±0.5

2.4

ETOT(HT)

Measured using full-scale IP, TOP = 25°C to 85°C

–2.4

±1.5

2.4

ETOT(LT)

Measured using full-scale IP, TOP = –40°C to 25°C

–3.5

±2

3.5

Total Output Error Drift Over

Lifetime [3]

ΔETOT(LIFE)

TOP = –40°C to 85°C, shift after AEC-Q100 grade 0

qualification testing

–1.9

±0.6

1.9

See Characteristic Performance Data page for parameter distributions over temperature range.

This parameter may drift a maximum of ΔSensLIFE over lifetime.

Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot be guaranteed. Drift

is a function of customer application conditions. Contact Allegro MicroSystems for further information.

±3 sigma noise voltage.

Drift is referred to ideal VIOUT(QBI) = 0.5 V.

This parameter may drift a maximum of ΔVOE(LIFE) over lifetime.

This parameter may drift a maximum of ΔETOT(LIFE) over lifetime.

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