STM32WB10CC datasheet(102/110 Pages) STMICROELECTRONICS

102 / 110 page

Electrical characteristics

STM32WB10CC

102/110

DS13259 Rev 2

JTAG/SWD interface characteristics

Unless otherwise specified, the parameters given in Table 77 and Table 78 are derived from

tests performed under the ambient temperature, fPCLKx frequency and supply voltage

conditions summarized in Table 20: General operating conditions. with the following

configuration:



Capacitive load C = 30 pF



Measurement points are done at CMOS levels: 0.5 ₓ VDD

Refer to Section 6.3.16 for more details on the input/output alternate function characteristics

(CK, SD, WS).

Table 77. JTAG characteristics

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

1/tc(TCK)

TCK clock frequency

2.7 < VDD < 3.6 V

MHz

2.0 < VDD < 3.6 V

tisu(TMS)

TMS input setup time

2.5

tih(TMS)

TMS input hold time

2.0

tisu(TDI)

TDI input setup time

2.0

tih(TDI)

TDI input hold time

2.0

tov(TDO)

TDO output valid time

2.7 < VDD < 3.6 V

13.5

16.5

2.0 < VDD < 3.6 V

13.5

23.0

toh(TDO)

TDO output hold time

11.0

Table 78. SWD characteristics

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

1 / tc(SWCLK) SWCLK clock frequency

2.7 < VDD < 3.6 V

MHz

2.0 < VDD < 3.6 V

tisu(TMS)

SWDIO input setup time

2.5

tih(TMS)

SWDIO input hold time

2.0

tov(TDO)

SWDIO output valid time

2.7 < VDD < 3.6 V

2.0 < VDD < 3.6 V

toh(TDO)

SWDIO output hold time

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