STM32WB55CC datasheet(98/193 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32WB55xx STM32WB35xx

98/193

DS11929 Rev 11

6.3.7

Embedded voltage reference

The parameters given in Table 36 are derived from tests performed under the ambient

temperature and supply voltage conditions summarized in Table 24: General operating

conditions.

Figure 21. VREFINT vs. temperature

Table 36. Embedded internal voltage reference

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VREFINT

Internal reference voltage

–40 °C < TA < +125 °C

1.182 1.212

1.232

tS_vrefint (1)

ADC sampling time when reading

the internal reference voltage

-4(2)

µs

tstart_vrefint

Start time of reference voltage

buffer when ADC is enabled

12(2)

IDD(VREFINTBUF)

VREFINT buffer consumption from

VDD when converted by ADC

12.5

20(2)

µA

∆VREFINT

Internal reference voltage spread

over the temperature range

VDD = 3 V

7.5(2)

TCoeff

Temperature coefficient

–40 °C < TA < +125 °C

50(2)

ppm/°C

ACoeff

Long term stability

1000 hours, T = 25 °C

300

1000(2)

ppm

VDDCoeff

Voltage coefficient

3.0 V < VDD < 3.6 V

250

1200(2)

ppm/V

VREFINT_DIV1

1/4 reference voltage

VREFINT

VREFINT_DIV2

1/2 reference voltage

VREFINT_DIV3

3/4 reference voltage

1. The shortest sampling time can be determined in the application by multiple iterations.

2. Guaranteed by design.

MSv40169V1

1.185

1.19

1.195

1.2

1.205

1.21

1.215

1.22

1.225

1.23

1.235

-40

-20

100

120

°C

Mean

Min

Max

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