PPC5605BAMLL4R datasheet(66/114 Pages) NXP

66 / 114 page

MPC5607B Microcontroller Data Sheet, Rev. 10

Electrical characteristics

NXP Semiconductors

•

Software recommendations

− The software flowchart must include the management of runaway

conditions such as:

— Corrupted program counter

— Unexpected reset

— Critical data corruption (control registers...)

•

Prequalification trials

− Most of the common failures (unexpected reset and program counter

corruption) can be reproduced by manually forcing a low state on the reset pin or the oscillator pins

for 1 second.

To complete these trials, ESD stress can be applied directly on the device. When unexpected

behavior is detected, the software can be hardened to prevent unrecoverable errors occurring.

4.10.2

Electromagnetic interference (EMI)

The product is monitored in terms of emission based on a typical application. This emission test conforms

to the IEC61967-1 standard, which specifies the general conditions for EMI measurements.

4.10.3

Absolute maximum ratings (electrical sensitivity)

Based on two different tests (ESD and LU) using specific measurement methods, the product is stressed

in order to determine its performance in terms of electrical sensitivity.

4.10.3.1

Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of

each sample according to each pin combination. The sample size depends on the number of supply pins in

the device (3 parts

×(n + 1) supply pin). This test conforms to the AEC-Q100-002/-003/-011 standard.

Table 33. EMI radiated emission measurement1,2

1 EMI testing and I/O port waveforms per IEC 61967-1, -2, -4

2 For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your

local marketing representative.

Symbol

Parameter

Conditions

Value

Unit

Min

Typ

Max

—

SR — Scan range

—

0.150

1000 MHz

fCPU

SR — Operating frequency

—

MHz

VDD_LV SR — LV operating voltages

—

1.28

—

SEMI

CC T Peak level

VDD = 5V, TA =25°C,

LQFP144 package

Test conforming to IEC

61967-2,

fOSC = 8 MHz/fCPU =

64 MHz

No PLL frequency

modulation

—

dBµV

± 2% PLL frequency

modulation

—

dBµV

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