| Electronic Components Datasheet Search |
|
L9963T Datasheet(PDF) 16 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
L9963T Datasheet(HTML) 16 Page - STMicroelectronics |
|
16 / 45 page ![]() Symbol Parameters Test conditions Min Typ Max Unit VIN_HYS Input hysteresis. Calculation VIN_H-VIN_L 0.15 - 0.4 V fCUT_DIG_IN Input Buffer RC filter. Applies to BNE_CPOL, NSLAVE, TXEN_CPHA, SPICLKFREQ, DIS. Design info, not tested in ATE 0.7 - 1 MHz TRC_DELAY Analog delay introduced by the fCUT_DIG_IN RC filter. VIO = 3.3 V - - 700 ns RIN_PD Input pull down resistor. Applies to SCK, SDI. - 70 100 130 kΩ RIN_PU Input pull up resistor. Applies to NCS, TXAMP, DIS. - 70 100 130 kΩ TTXEN_DEGLITCH Up/Reset counter to avoid glitches on TXEN input. The counter counts up if TXEN is stable. The counter is reset upon a TXEN glitch (whatever slope). TXEN must be stable at least TTXEN_DEGLITCH before the NCS assertion. Guaranteed by SCAN 562.5 625 687.5 ns TTXEN_HOLD TXEN hold time after the NCS assertion. - - 300 ns TTXAMP_DEGLITCH Up/Reset counter to avoid glitches on TXAMP input. The counter counts up if TXAMP is stable. The counter is reset upon a TXAMP glitch (whatever slope). TXAMP must be stable at least TTXAMP_DEGLITCH + TTXAMP_SETUP before the NCS assertion. 562.5 625 687.5 ns TTXAMP_HOLD TXAMP hold time after the NCS assertion. - - 300 ns TISOFREQ_DEGLITCH Up/Reset counter to avoid glitches on ISOFREQ input. The counter counts up if ISOFREQ is stable. The counter is reset upon a ISOFREQ glitch (whatever slope). ISOFREQ must be stable at least TISOFREQ_DEGLITCH+TISOFREQ_SETUP before the NCS assertion. 562.5 625 687.5 ns TISOFREQ_HOLD ISOFREQ hold time after the NCS assertion. - - 300 ns IIN_PD Input pull down current. Applies to NSLAVE, ISOFREQ, BNE/CPOL. VPIN = 5 V 35 50 65 μA IIN_PU Input pull up current. Applies to TXEN/CPHA. VPIN = 0 V 35 50 65 μA 3.2.1.8.2 Digital output 3.2.1.8.2.1 Output buffer All parameters are tested and guaranteed in the following conditions, unless otherwise specified: 4.5 V ≤ VVDD ≤ 5.5 V ; -40 °C < Tj < 125 °C Table 12. Output buffer electrical characteristics Symbol Parameters Test conditions Min Typ Max Unit VOUT_L Low output level. I = 2 mA 0 - 0.4 V VOUT_H High output level. I = -2 mA VIO-0.4 - VIO V TOUT_trans Digital output Rise and Fall time. Not valid for SDO. Cload = 12 0pF 20-80% on rising edge of DIG_OUT 80-20% on falling edge of DIG_OUT 5 - 400 ns TBNE_SHORT_DET BNE output short detection filter time. Guaranteed by SCAN - 5 - μs L9963T Pin configuration DS13590 - Rev 4 page 16/45 |
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |