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PCD5032 Datasheet(PDF) 16 Page - NXP Semiconductors |
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PCD5032 Datasheet(HTML) 16 Page - NXP Semiconductors |
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16 / 24 page ![]() 1997 Apr 03 16 Philips Semiconductors Product specification ADPCM CODEC for digital cordless telephones PCD5032 11 FILTER CHARACTERISTICS VDD = 2.7 to 5.5 V; VSS =0V; Tamb = −25 to +70 °C. Notes 1. Frequency band is 300 Hz to 3400 Hz. Maximum load capacitance = 100 pF differentially, or 200 pF each pin. 2. Measured with psophometric filter (CCITT G.223). Only fulfilled at VDD noise level less than 40 mV (peak value) (0 to 20 kHz). Measured on sample basis at VDD = 3.0 V,Tamb =25 °C, compliant with G.712. Signal level is −40 dBm0 on PCM interface; 0.4 mV (RMS) on analog input. Gain setting is 0 dB. 3. Group delay includes ADPCM/PCM conversion; signal frequency = 1.5 kHz. Value given is for RAS/TAS signals asserted simultaneously. SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT Transmitter RPB passband ripple (300 to 3000 Hz) −− 0.5 dB frequency response f = 50 Hz −35 −−2dB f = 3400 Hz −35 −−2dB f = 4600 Hz −35 −−2dB f = 8000 Hz −60 −−2dB Analog-to-Digital converter S/N signal-to-noise ratio Fig.10; notes 1 and 2 35 −− dB Digital-to-Analog converter S/N signal-to-noise ratio Fig.10; notes 1 and 2 35 −− dB Group delay td(TX) transmitter note 3 −− 400 µs td(RX) receiver note 3 −− 525 µs td(g) group delay distortion (Loop 1) Fig.11 tbf tbf tbf µs handbook, halfpage MGK078 22 27 33 10 0 20 30 40 50 60 70 80 −60 −70 −50 −40 −30 −20 −10 0 +10 input level (dBm0) S/(N + THD) G.712 Fig.10 Typical performance of AD and DA in cascade. handbook, halfpage MGK077 0.0 td(g) 250.0 µs 500.0 µs 750.0 µs 1.0 ms 1.5 ms 1.75 ms 1.25 ms 300 500 600 1000 1500 2600 2800 3400 CCITT G.712 frequency (Hz) Fig.11 Group delay distortion: Transmit and Receive (loop measurement). |
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