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TPCF8104 Datasheet(PDF) 5 Page - Toshiba Semiconductor |
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TPCF8104 Datasheet(HTML) 5 Page - Toshiba Semiconductor |
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5 / 7 page ![]() TPCF8104 2006-11-16 5 Drain-source voltage VDS (V) Capacitance – VDS 1 -0.1 10 100 1000 10000 -1 -10 -100 Ciss Coss Crss Common source VGS = 0 V f = 1 MHz Ta = 25°C Ambient temperature Ta (°C) RDS (ON) – Ta Total gate charge Qg (nC) Dynamic input/output characteristics Ambient temperature Ta (°C) Vth – Ta 0 -1 -2 -4 −80 −40 0 40 80 120 160 -3 Common source VDS = -10 V ID = -1 mA Pulse test Ambient temperature Ta (°C) PD – Ta Drain-source voltage VDS (V) IDR – VDS 0 -1 0.4 -10 -100 1.2 1.6 VGS = 0 V -10 -4.5 -1 -2 0.8 2 Common source Ta = 25°C Pulse test -3 -8 -4 -16 0 0 -10 -30 VDD = -24 V VDS VGS -6 -12 -40 -50 -40 -20 -10 -30 0 -20 Common source ID = -6 A Ta = 25°C Pulse test -12 0 0 40 80 120 160 0.5 1.5 2 2.5 3 1 (1) t = 5 s (1) DC (2) t = 5 s (2) DC (1) Device mounted on a glass-epoxy board (a) (Note 2a) (2) Device mounted on a glass-epoxy board (b) (Note 2b) 160 −40 0 40 80 120 −80 50 40 30 20 10 0 ID = -6A -1.5A -3A VGS = -10 V Common source Pulse test VGS = -4.5 V ID =− 6A -1.5A -3A |
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