LM7332

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SNOSAV4B – APRIL 2008 – REVISED JANUARY 2016

6.5

5-V Electrical Characteristics

Unless otherwise specified, all limits are ensured for TA = 25°C, V

+ = 5 V, V− = 0 V, V

CM = 0.5 V, VO = 2.5 V, and RL > 1 MΩ

to 2.5 V.

(1)

PARAMETER

TEST CONDITIONS

MIN (2)

TYP (3)

MAX (2)

UNIT

VCM = 0.5 V and VCM = 4.5 V

−4

±1.6

4

VOS

Input offset voltage

mV

At the temperature extremes

–5

5

Input offset voltage temperature

TC VOS

VCM = 0.5 V and VCM = 4.5 V

(4)

±2

µV/°C

drift

See (5)

−2

±1

2

IB

Input bias current

µA

At the temperature extremes

−2.5

2.5

20

250

IOS

Input offset current

nA

At the temperature extremes

300

0 V

≤ VCM ≤ 3 V

67

80

At the temperature extremes

65

CMRR

Common-mode Rejection Ratio

dB

0 V

≤ VCM ≤ 5 V

62

70

At the temperature extremes

60

5 V

≤ V+ ≤ 30 V

78

100

PSRR

Power supply Rejection Ratio

dB

At the temperature extremes

74

−0.3

−0.1

CMRR > 50 dB

5.1

Input common-mode Voltage

CMVR

V

Range

5.3

0

At the temperature extremes

5

0.5 V

≤ VO ≤ 4.5 V

70

77

RL = 10 kΩ to 2.5 V

AVOL

Large signal Voltage Gain

dB

At the temperature extremes

65

RL = 10 kΩ to 2.5 V

60

150

VID = 100 mV

At the temperature extremes

200

Output swing

high

RL = 2 kΩ to 2.5 V

100

300

VID = 100 mV

At the temperature extremes

350

mV from

VO

either rail

RL = 10 kΩ to 2.5 V

5

150

VID = −100 mV

At the temperature extremes

200

Output swing

low

RL = 2 kΩ to 2.5 V

20

300

VID = −100 mV

At the temperature extremes

350

Sourcing from V+, VID = 200 mV

(6)

60

90

ISC

Output short circuit current

mA

Sinking to V−, VID = –200 mV

(6)

60

90

IOUT

Output current

VID = ±200 mV, VO = 1 V from rails

±55

mA

No Load, VCM = 0.5 V

1.5

2.3

IS

Total supply current

mA

At the temperature extremes

2.6

AV = +1, VI = 5-V Step, RL = 1 MΩ,

SR

Slew rate(7)

12

V/µs

CL = 10 pF

fu

Unity-gain frequency

RL = 10 MΩ, CL = 20 pF

7.5

MHz

(1)

Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in

very limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical

tables under conditions of internal self-heating where TJ > TA.

(2)

All limits are ensured by testing or statistical analysis.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

(4)

Offset voltage temperature drift determined by dividing the change in VOS at temperature extremes into the total temperature change.

(5)

Positive current corresponds to current flowing in the device.

(6)

Short-circuit test is a momentary test. Output short circuit duration is infinite for VS ≤ 6 V at room temperature and below. For VS > 6 V,

allowable short circuit duration is 1.5 ms.

(7)

Slew rate is the slower of the rising and falling slew rates. Connected as a voltage follower.

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