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AFE5804 Datasheet(PDF) 13 Page - Texas Instruments

Part # AFE5804
Description  ADS5294 Octal-Channel 14-Bit 80-MSPS High-SNR and Low-Power ADC
PDF  82 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

AFE5804 Datasheet(HTML) 13 Page - Texas Instruments

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ADS5294
www.ti.com
SLAS776E – NOVEMBER 2011 – REVISED APRIL 2018
Product Folder Links: ADS5294
Submit Documentation Feedback
Copyright © 2011–2018, Texas Instruments Incorporated
(1)
Timing parameters are ensured by design and characterization and not tested in production.
(2)
Measurements are done with a transmission line of 100-Ω characteristic impedance between the device and the load. Set-up and hold
time specifications take into account the effect of jitter on the output data and clock.
(3)
Data valid refers to logic HIGH of 100 mV and logic LOW of –100 mV.
8.7 Timing Requirements
Typical values are at 25°C, AVDD = 1.8 V, LVDD = 1.8 V, sampling frequency = 80 MSPS, 14-bit, sine wave input clock = 1.5
Vpp clock amplitude, CLOAD = 5 pF, RLOAD = 100 Ω, unless otherwise noted. MIN and MAX values are across the full
temperature range TMIN = –40°C to TMAX = 85°C, AVDD = 1.8 V, LVDD = 1.7 V to 1.9 V
(1) (2) (3)
MIN
TYP
MAX
UNIT
ta
Aperture delay
The delay in time between the rising edge of the input
sampling clock and the actual time at which the sampling
occurs
4
ns
Aperture delay variation
Across channels within the same device
±175
ps
Across devices at the same temperature and LVDD supply
2.5
ns
tj
Aperture jitter RMS
320
fs rms
td
Data latency
1-wire LVDS output interface
11
Clock
cycles
2-wire LVDS output interface
15
Clock
cycles
tSU
Data set-up time
80 MSPS, 2-wire LVDS, 7x-serialization
0.34
0.57
ns
tH
Data hold time
80 MSPS, 2-wire LVDS, 7x-serialization
0.55
0.8
ns
tPROP
Clock propagation delay
Input clock rising edge (zero cross) to frame clock rising
edge (zero cross)
See LVDS Timing at Different
Sampling Frequencies — 2-Wire
Interface, 7x-Serialization, Digital
Filter Disabled and LVDS Timing at
Different Sampling Frequencies —
1-Wire Interface, 14x-Serialization,
Digital Filter Disabled
Variation of tPROP
Between two devices at same temperature and LVDD supply
±0.75
ns
LVDS bit clock duty cycle
48%
tRISE
Data rise time
Rise time is from –100 mV to + 100 mV, 10
≤ Fs ≤ 80 MSPS
0.24
ns
tFALL
Data fall time
Fall time is from +100 mV to –100 mV, 10
≤ Fs ≤ 80 MSPS
0.24
ns
tCLKRISE
Output clock rise time
Rise time is from –100 mV to +100 mV, 10
≤ Fs ≤ 80 MSPS
0.20
ns
tCLKFALL
Output clock fall time
Fall time is from +100 mV to –100 mV, 10
≤ Fs ≤ 80 MSPS
0.20
ns
tWAKE
Wake-up Time
Time to valid data after coming out of COMPLETE POWER-
DOWN mode
100
µs
Time to valid data after coming out of PARTIAL POWER-
DOWN mode (with clock continuing to run during power-
down)
5
µs



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