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Four “Quickset” modes simplify instrument setup. With

one touch, the instrument can be quickly configured for

various operating modes without the need to configure the

instrument indirectly for this operation.

One-touch Quickset modes speed measurement setups and minimize the

time to measurements.

Comprehensive Built-in Connectivity

Rear panel access to rear-input connectors, remote

control interfaces (GPIB, USB 2.0, and LXI/Ethernet),

D-sub 9-pin digital I/O port (for internal/external trigger

signals and handler control), instrument interlock control,

and TSP-Link® jacks make it simple to configure multiple

instrument test solutions and eliminate the need to invest

in additional adapter accessories..

Convert Raw Data to Information

A full graphical plotting window converts raw data and

displays it immediately as useful information, such as

semiconductor I-V curves and digitized waveforms.

The touchscreen interface makes it easy to observe,

interact with, and explore measurements with “pinch

and zoom” simplicity. By using the built-in graphing

cursors, you can immediately analyze your data without

a PC. All graphic screens can be saved to a USB thumb

drive for incorporation into reports and journals. Using

the graphical SMU’s Sheet view, test data can also

be displayed in tabular form. The instrument supports

exporting data to a spreadsheet for further analysis,

dramatically improving productivity for research, benchtop

testing, device qualification, and debugging. This

combination of high performance and high ease of use

offers unparalleled insight into your test results.

2461 rear panel connections are optimized to maintain signal integrity and speed system setup.

Ethernet

Mass screw terminal connections

Digital I/O TSP-Link

GPIB

Interlock

USB