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ADIS16060/PCBZ Datasheet(PDF) 1 Page - Analog Devices |
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ADIS16060/PCBZ Datasheet(HTML) 1 Page - Analog Devices |
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1 / 12 page ![]() Wide Bandwidth Yaw Rate Gyroscope with SPI ADIS16060 Rev. 0 Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibilityis assumedbyAnalogDevicesforitsuse,norforanyinfringements of patents or other rightsofthirdpartiesthatmayresultfromitsuse.Specificationssubjecttochangewithoutnotice.No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarksandregisteredtrademarksarethepropertyoftheirrespectiveowners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2008 Analog Devices, Inc. All rights reserved. FEATURES Complete angular rate digital gyroscope 14-bit resolution Scalable measurement range Initial range: ±80°/sec (typical) Increase range with external resistor Z-axis (yaw rate) response SPI digital output interface High vibration rejection over wide frequency 2000 g-powered shock survivability 1 kHz bandwidth Selectable using external capacitor Externally controlled self-test Internal temperature sensor output Dual auxiliary 14-bit ADC inputs Absolute rate output for precision applications 5 V single-supply operation 8.2 mm × 8.2 mm × 5.2 mm package −40°C to +105°C operation RoHS compliant APPLICATIONS Platform stabilization Image stabilization Guidance and control Inertia measurement units Robotics GENERAL DESCRIPTION The ADIS16060 is a yaw rate gyroscope with an integrated serial peripheral interface (SPI). It features an externally selectable bandwidth response and scalable dynamic range. The SPI port provides access to the rate sensor, an internal temperature sensor, and two external analog signals (using internal ADC). The digital data available at the SPI port is proportional to the angular rate about the axis that is normal to the top surface of the package. An additional output pin provides a precision voltage reference. A digital self-test function electromechanically excites the sensor to test the operation of the sensor and the signal-conditioning circuits. The ADIS16060 is available in an 8.2 mm × 8.2 mm × 5.2 mm, 16-terminal, peripheral land grid array (LGA) package. FUNCTIONAL BLOCK DIAGRAM RATE SENSOR SCLK VCC FILT RATE GND ADIS16060 DIN DOUT MSEL1 MUX MSEL2 14-BIT ADC DIGITAL CONTROL AIN1 AIN2 TEMPERATURE SENSOR Figure 1. |
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