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IP4365CX11/P Datasheet(PDF) 5 Page - NXP Semiconductors |
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IP4365CX11/P Datasheet(HTML) 5 Page - NXP Semiconductors |
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5 / 12 page ![]() IP4365CX11_1 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 01 — 26 March 2010 5 of 12 NXP Semiconductors IP4365CX11 Integrated SIM card passive filter array and USB ESD protection 7.2 Insertion loss The IP4365CX11 is mainly designed as an EMI/RFI filter for SIM card interfaces. The insertion loss measurement configuration of a typical 50 Ω NetWork Analyzer (NWA) system for evaluation of the IP4365CX11 is shown in Figure 4. The insertion loss in a 50 Ω NWA system for all three resistor equipped channels of IP4365CX11 is depicted in Figure 5. The insertion loss is measured with a test Printed-Circuit Board (PCB) utilizing laser drilled micro-via holes that connect the PCB ground plane to the ground pins. Fig 4. Frequency response measurement configuration (1) Channel B1 to B3. (2) Channel C1 to C3. (3) Channel A1 to A3. Fig 5. Measured insertion loss magnitudes OUT 001aai755 50 Ω 50 Ω Vgen DUT IN TEST BOARD 008aaa214 f (MHz) 10−1 103 104 102 110 −20 −30 −10 0 s21 (dB) −40 (1) (3) (2) |
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