CDCM61002

www.ti.com

SCAS870D – FEBRUARY 2009 – REVISED JULY 2010

ELECTRICAL CHARACTERISTICS

CDCM61002

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Control Pin LVCMOS Input Characteristics

Input high voltage

V

Input low voltage

V

Input high current

200

mA

Input low current

–200

mA

Bypass output frequency

21.875

28.47

MHz

Output frequency

43.75

250

MHz

Output high voltage

V

Output low voltage

0.3

V

RMS phase jitter

250 MHz (10 kHz to 20 MHz)

0.85 ps, RMS

Output rise/fall slew rate

20% to 80%

2.4

V/ns

ODC

Output duty cycle

45

55

%

Skew between outputs

50

ps

Device current, LVCMOS

120

140

mA

LVCMOS

Output frequency

43.75

683.264

MHz

Output high voltage

V

Output low voltage

V

Differential output voltage

0.6

1.23

V

RMS phase jitter

625 MHz (10 kHz to 20 MHz)

0.77 ps, RMS

Output rise/fall time

20% to 80%

175

ps

ODC

Output duty cycle

45

55

%

Skew between outputs

20

ps

Device current, LVPECL

126

144

mA

LVPECL

(1)

Figure 9 and Figure 10 show dc and ac test setups, respectively. Jitter measurements made using 25-MHz quartz crystal in.

(2)

Figure 11 and Figure 12 show dc and ac test setups, respectively. Jitter measurements made using 25-MHz quartz crystal in.

Copyright © 2009–2010, Texas Instruments Incorporated

Submit Documentation Feedback

5

Product Folder Link(s): CDCM61002