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SST30VR043 Datasheet(PDF) 8 Page - Silicon Storage Technology, Inc |
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SST30VR043 Datasheet(HTML) 8 Page - Silicon Storage Technology, Inc |
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8 / 10 page ![]() 8 Preliminary Specifications 4 Mbit ROM + 1 Mbit / 256 Kbit SRAM ROM/RAM Combo SST30VR041 / SST30VR043 ©2001 Silicon Storage Technology, Inc. S71134-02-000 4/01 381 FIGURE 8: SRAM WRITE CYCLE TIMING DIAGRAM TABLE 8: FUNCTIONAL DESCRIPTION/TRUTH TABLE Address Inputs ROMCS# OE#/RAMCS#1 (Pin 32) 1. OE# & RAMCS# are pin-shared WE# DQ7-DQ0 X2 2. X means Don’t Care. H H X Z Standby AMS3-A0 3. For ROM: AMS = A18 for SST30VR041 and SST30VR043 L OE# (H) X Z Output Floating AMS3-A0 LOE# (L) X DOUT ROM Read Only AMS4-A0 are valid 4. For RAM: AMS = A16 for SST30VR041, A18-A17 must be fixed to “L” or “H” AMS = A14 for SST30VR043, A18-A15 must be fixed to “L” or “H” HRAMCS# (L) H DOUT RAM Read Only AMS4-A0 are valid H RAMCS# (L) L DIN RAM Write T8.3 381 TWC TAW TCW(2) TOH TDH TDW TOW TWR(4) Data Valid 381 ILL F06.0 Data In Data Out WE# OE#/RAMCS# High-Z High-Z (6) (7) (8) Address TWP(1) TAS(3) TWHZ(5) Notes: 1. A write occurs during the overlap (TWP) of a low RAMCS# and low WE#. A write begins at the latest transition among RAMCS# going low and WE# going low: A write end at the earliest transition among RAMCS# going high and WE# going high, TWP is measured from the beginning of write to the end of write. 2. TCW is measured from the later of RAMCS# going low to the end of write. 3. TAS is measured from the address valid to the beginning of write. 4. TWR is measured from the end of write to the address change. 5. If RAMCS#, WE# are in the read mode during this period, the I/O pins are in the outputs Low-Z state. Inputs of opposite phase of the output must not be applied because bus contention can occur. 6. If RAMCS# goes low simultaneously with WE# going low or after WE# going low, the outputs remain high impedance state. 7. DOUT is the same phase of the latest written data in this write cycle. 8. DOUT is the read data of new address 9. ROMCS# = VIH |
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