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ADSP-21062LABZ-160 Datasheet(PDF) 47 Page - Analog Devices |
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ADSP-21062LABZ-160 Datasheet(HTML) 47 Page - Analog Devices |
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47 / 64 page ![]() ADSP-21060/ADSP-21060L/ADSP-21062/ADSP-21062L/ADSP-21060C/ADSP-21060LC Rev. F | Page 47 of 64 | March 2008 TEST CONDITIONS For the ac signal specifications (timing parameters), see Timing Specifications on Page 21. These specifications include output disable time, output enable time, and capacitive loading. The timing specifications for the DSP apply for the voltage reference levels in Figure 28. Output Disable Time Output pins are considered to be disabled when they stop driv- ing, go into a high impedance state, and start to decay from their output high or low voltage. The time for the voltage on the bus to decay by 'V is dependent on the capacitive load, C L, and the load current, IL. This decay time can be approximated by the fol- lowing equation: The output disable time tDIS is the difference between tMEASURED and tDECAY as shown in Figure 29. The time tMEASURED is the interval from when the reference signal switches to when the output voltage decays 'V from the measured output high or output low voltage. tDECAY is calculated with test loads CL and IL, and with 'V equal to 0.5 V. Output Enable Time Output pins are considered to be enabled when they have made a transition from a high impedance state to when they start driv- ing. The output enable time tENA is the interval from when a reference signal reaches a high or low voltage level to when the output has reached a specified high or low trip point, as shown in the Output Enable/Disable diagram (Figure 29). If multiple pins (such as the data bus) are enabled, the measurement value is that of the first pin to start driving. Example System Hold Time Calculation To determine the data output hold time in a particular system, first calculate tDECAY using the equation given above. Choose 'V to be the difference between the ADSP-2106x’s output voltage and the input threshold for the device requiring the hold time. A typical 'V will be 0.4 V. C L is the total bus capacitance (per data line), and IL is the total leakage or three-state current (per data line). The hold time will be tDECAY plus the minimum disable time (i.e., tDATRWH for the write cycle). Capacitive Loading Output delays and holds are based on standard capacitive loads: 50 pF on all pins (see Figure 30). The delay and hold specifica- tions given should be derated by a factor of 1.5 ns/50 pF for loads other than the nominal value of 50 pF. Figure 32, Figure 33, Figure 37, and Figure 38 show how output rise time varies with capacitance. Figure 34 and Figure 36 show graphically how output delays and holds vary with load capaci- tance. (Note that this graph or derating does not apply to output disable delays; see the previous section Output Disable Time under Test Conditions.) The graphs of Figure 32, Figure 33, Figure 37, and Figure 38 may not be linear outside the ranges shown. Output Drive Characteristics Figure 31 shows typical I-V characteristics for the output driv- ers of the ADSP-2106x. The curves represent the current drive capability of the output drivers as a function of output voltage. Figure 28. Voltage Reference Levels for AC Measurements (Except Output Enable/Disable) Figure 29. Output Enable/Disable INPUT OR OUTPUT 1.5V 1.5V PEXT CL V ' IL -------------- = REFERENCE SIGNAL tDIS OUTPUT STARTS DRIVING VOH (MEASURED) - V VOL (MEASURED) + V tMEASURED VOH (MEASURED) VOL (MEASURED) 2.0V 1.0V VOH (MEASURED) VOL (MEASURED) HIGH IMPEDANCE STATE. TEST CONDITIONS CAUSE THIS VOLTAGE TO BE APPROXIMATELY 1.5V OUTPUT STOPS DRIVING tENA tDECAY Figure 30. Equivalent Device Loading for AC Measurements (Includes All Fixtures) +1.5V 50pF TO OUTPUT PIN IOL IOH |
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