DocID022757 Rev 4

3/11

TN0873

Space-grade description

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1.4.1

Electrical wafer sort

The electrical wafer sort carried out on the parts ensures that the tested parts comply with

the functional and electrical specification of the packaged versions as described in the

datasheet.

1.4.2

S.E.M inspection

The S.E.M inspection is made in compliance with the governing specification, which

depends on the product family:

•

Diodes: no S.E.M inspection

•

Bipolar transistor: S.E.M inspection as per MIL-STD-750 method 2077 for all orders

•

MOSFET: S.E.M inspection as per MIL-STD-750 method 2077 for all orders

•

Logic and other ICs: S.E.M inspection as per MIL-STD-883 method 2018 for all orders.

For bipolar transistors and MOSFETs, an S.E.M inspection report is optional and incurs

costs. An S.E.M inspection report is provided by default with each shipment of integrated

circuits in die form with the ST space-grade.

1.4.3

Radiation test

Products with a guaranteed radiation level are qualified in radiation with the flow of their

packaged counterparts, either as per the qualifying agency specification or according to an

ST internal specification (the latter only for product without version with guaranteed radiation

level qualified as such by an agency).

The Radiation Verification Test report is provided with each shipment of radiation

guaranteed parts. The details of the test (total dose, dose rate, biasing conditions, etc) are

product family dependent.

Table 1. Summary of production flow

Step description

Discrete products

Integrated circuits

Comments

Electrical wafer sort

100%

100%

See 1.4.1

S.EM. inspection

Bipolar transistors: 100%

MOSFET: 100%

Diodes: No

100%

See 1.4.2

Radiation test

Bipolar transistors: if applicable

MOSFET: 100%

Diodes: No

100%

See 1.4.3

Wafer qualification

100%

100%

See 1.4.4

Visual test

ESCC2045000 @ 100%

ESCC2049000 @ 100%

See 1.4.5

Conditioning

Waffle pack

See 1.4.6

Packing

Vacuum sealed anti-static bag

See 1.4.6