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AN4022 Datasheet(PDF) 8 Page - STMicroelectronics

Part # AN4022
Description  TVS short pulse dynamic resistance measurement and correlation with TVS clamping voltage during ESD
PDF  15 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN4022 Datasheet(HTML) 8 Page - STMicroelectronics

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Predicted results versus measured results
AN4022
8/15
DocID022589 Rev 2
3
Predicted results versus measured results
With this information, we can now estimate the residual voltages remaining after the
protection device and compare these results with the results obtained during ESD surge
measurements. For this comparison the IEC61000-4-2 in contact mode has been selected.
In the standard, the current levels are specified versus the charging voltage (Figure 11).
Figure 11. Extract of IEC61000-4-2 standard [page 12], current levels versus charge
voltage levels (a)
From this table we can calculate the minimum and maximum current values that can be
found in our circuit, based on the tolerances specified (
±15% or ±30% versus typical
values). The expected values are summarized in Table 1.
a.STMicroelectronics thanks the International Electrotechnical Commission (IEC) for
permission to reproduce Information from its International Standard IEC 61000-4-2 ed.2.0
(2008).
All such extracts are copyright of IEC, Geneva, Switzerland. All rights reserved. Further
information on the IEC is available from www.iec.ch. IEC has no responsibility for the
placement and context in which the extracts and contents are reproduced by
STMicroelectronics, nor is IEC in any way responsible for the other content or accuracy
therein.
Table 1. Minimum, typical and maximum current values versus charge voltage
Level VPP (kV)
Peak current (±15%)
IPP@ 30 ns (±30%)
IPP@ 60 ns (±30%)
1
2
6.37
7.5
8.62
2.8
4
5.2
1.4
2
2.6
2
4
12.75
15
17.25
5.6
8
10.4
2.8
4
5.2
3
6
19.12
22.5
25.87
8.4
12
15.6
4.2
6
7.8
4
8
25.5
30
34.5
11.2
16
20.8
5.6
8
10.4



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