February 2015

DocID027438 Rev 1

1/13

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AN4653

Application note

Cycling endurance and data retention of high density EEPROM

based on CMOS F8H process

Introduction

Electronic applications, based on several single electronic products (integrated circuits) are

looking for a global high level of reliability and robustness, each single electronic product

must therefore offer a very high level of quality.

To fulfill these requirements STMicroelectronics developed a new family of EEPROM based

on a new improved architecture and produced with the CMOS F8H process.

This application note details the improved cycling and data retention performances of the

high density (more than 256 Kbit) EEPROM industrial range 6 (temperature range -40°C to

+85°C) products, listed in Table 1.

Table 1. Applicable products

Type

Serial interface

Root Part Numbers

Standard

Serial

EEPROM

I2C bus

M24256-BF, M24256-BR, M24256-BW, M24256-DF, M24256-DR

M24512-DF, M24512-R, M24512-W

M24M01-DF, M24M01-R

M24M02-DR

SPI bus

M95256-DF, M95256-R, M95256-W

M95512-DF, M95512-R, M95512-W

M95M01-DF, M95M01-R

M95M02-DR

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