TLE7258D

Application Information

Data Sheet

25

Rev. 1.2, 2014-12-08

7.2

ESD Susceptibility according to IEC61000-4-2

Test for ESD robustness according to IEC61000-4-2 “Gun test” (150 pF, 330 Ω) have been performed. The results

and test conditions are available in a separate test report.

7.3

Transient Robustness according to ISO 7637-2

Test for transient robustness according to ISO 7637-2 have been performed. The results and test conditions are

available in a separate test report.

7.4

LIN Physical Layer Compatibility

The TLE7258D fulfills the Physical Layer Specification of LIN 1.2, 1.3, 2.0, 2.1, 2.2 and 2.2A.

The differences between LIN specification 1.2 and 1.3 is mainly the physical layer specification. The reason was

to improve the compatibility between the nodes.

The LIN specification 2.0 is a super set of the 1.3 version. The 2.0 version offers new features. However, it is

possible to use the LIN 1.3 slave node in a 2.0 node cluster, as long as the new features are not used. Vice versa

it is possible to use a LIN 2.0 node in the 1.3 cluster without using the new features.

In terms of the physical layer the LIN 2.1, LIN 2.2 and LIN 2.2A Specification does not include any changes and

is fully compliant to the LIN Specification 2.0.

LIN 2.2A is the latest version of the LIN specification, released in December 2010. The physical layer specification

of LIN 2.2A will be included in the ISO 17987-4 without modifications.

Additionally, the TLE7258D is compliant to the SAE J2602-2 standard for usage in the US automotive market.

7.5

TxD Fail-Safe Input

The TxD input has an internal pull-up structure to avoid any bus disturbance in case the TxD input is open and

floating. In case of an not connected TxD input, the pin is pulled to an internal voltage supply (see Figure 1) and

the output to the LIN bus on the BUS pin is always “recessive”. Therefore the TLE7258D can not disturb the

communication on the LIN bus.

In order to optimize the quiescent current of the TLE7258D in Sleep mode, the pull-up structure inside the TxD

input is disabled in Sleep mode. The logic inside the TxD input is not reacting at any signal change provide to the

TxD input pin and the transmitter is turned off. In Sleep mode the TLE7258D can not disturb or block the LIN bus

in any case.

Table 7

ESD Susceptibility according to IEC61000-4-2

Performed Test

Result

Unit

Remarks

Electrostatic discharge voltage at pin

V

+10

kV

1) ESD susceptibility “ESD GUN” according IEC 61000-4-2, tested by external test house.

Electrostatic discharge voltage at pin

V

-10

kV

1)Negative pulse

Table 8

Automotive Transient Robustness according to ISO 7637-2

Performed Test

Result

Unit

Remarks

Pulse 1

-100

V

1)

1) Automotive Transient Robustness according to ISO 7637-2, tested by external test house.

Pulse 2

+75

V

1)

Pulse 3a

-150

V

1)

Pulse 3b

+100

V

1)