LMP8358MASLASHNOPB datasheet(8/40 Pages) TI1

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LMP8358

SNOSB09B – APRIL 2010 – REVISED MARCH 2013

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5.0V Electrical Characteristics (continued)

Unless otherwise specified, all limits are ensured for TA = 25°C. V

+ = 5.0V , V− = 0V, V

REF = V

+/2, V

CM = V

+/2, R

L = 10 kΩ to

VREF, CL = 10 pF; Serial Control Register: G[2:0] = 110b (Gain = 1000x), COMP[2:0] = 000b, MUX[1:0] = 00b, POL, SHDN,

FILT, PIN = 0b, CUR[2:0] = 000b. Boldface limits apply at the temperature extremes.

Symbol

Parameter

Conditions

Min(1)

Typ(2)

Max(1)

Units

ITEST

Fault Detection: Test Current

Setting 1 (CUR[2:0] = 001b), VCM < V

+ −

2.25V

Setting 2 (CUR[2:0] = 010b), VCM < V

+ −

100

2.25V

Setting 3 (CUR[2:0] = 011b), VCM < V

+ −

µA

2.25V

Setting 4 (CUR[2:0] = 100b), VCM < V

+ −

µA

2.25V

Setting 5 (CUR[2:0] = 101b), VCM < V

+ −

100

µA

2.25V

Electrical Characteristics (Serial Interface)

Unless otherwise specified, all limits ensured for TA = 25°C, V

+ − V− ≥ 2.7V, V+ ≥ VHSER/VLPAR, V− ≤ VLSER/VHPAR, V

D =

(VHSER/VLPAR)

− (VLSER/VHPAR) ≥ 2.5V.

Symbol

Parameter

Conditions

Min(1)

Typ(2)

Max(1)

Units

VIL

Input Logic Low Threshold

0.3 × VD

VIH

Input Logic High Threshold

0.7 × VD

VOL

Output Logic Low Threshold

ISDO = 2mA

0.2

VOH

Output Logic High Threshold

ISDO = 2mA

VD − 0.2V

ISDO

Output Source Current, SDO

VD = 3.3V or 5.0V,

−2

CSB = 0V, VOH = V

+ – 0.7V

Output Sink Current, SDO

VD = 3.3V or 5.0V,

CSB = 0V, VOL = 1.0V

IOZ

Output Tri-state Leakage Current,

VD = 3.3V or 5.0V,

±1

µA

SDO

CSB = VD = 3.3V or 5V

High Period, SCK

(3)

100

Low Period, SCK

(3)

100

Set Up Time, CSB to SCK

(3)

Set Up Time, SDI to SCK

(3)

Hold Time, SCK to SDI

(3)

Prop. Delay, SCK to SDO

(3)

Hold Time, SCK Transition to CSB

(3)

Rising Edge

CSB Inactive

(3)

Prop. Delay, CSB to SDO Active

(3)

t10

Prop. Delay, CSB to SDO Inactive

(3)

t11

Hold Time, SCK Transition to CSB

(3)

Falling Edge

tr/tf

Signal Rise and Fall Times

(3)

1.5

(1)

All limits are specified by testing or statistical analysis.

(2)

Typical Values indicate the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

(3)

Load for these tests is shown in the Timing Diagram Test Circuit.

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