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STW40N95K5 Datasheet(PDF) 4 Page - STMicroelectronics |
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STW40N95K5 Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 13 page ![]() Electrical characteristics STW40N95K5 4/13 DocID026447 Rev 2 2 Electrical characteristics (Tcase =25 °C unless otherwise specified) Table 4: On /off states Symbol Parameter Test conditions Min. Typ. Max. Unit V(BR)DSS Drain-source breakdown voltage VGS = 0, ID = 1 mA 950 V IDSS Zero gate voltage drain current VGS = 0, VDS = 950 V 1 µA VGS = 0, VDS = 950 V, TC=125 °C 50 µA IGSS Gate-body leakage current VDS=0, VGS = ± 20 V ±10 µA VGS(th) Gate threshold voltage VDS = VGS, ID = 100 µA 3 4 5 V RDS(on) Static drain-source on- resistance VGS = 10 V, ID = 19 A 0.110 0.130 Ω Table 5: Dynamic Symbol Parameter Test conditions Min. Typ. Max. Unit Ciss Input capacitance VGS=0, VDS =100 V, f=1 MHz - 3300 - pF Coss Output capacitance - 250 - pF Crss Reverse transfer capacitance - 2 - pF Co(tr)(1) Equivalent capacitance time related VGS = 0, VDS = 0 to 760 V - 398 - pF Co(er)(2) Equivalent capacitance energy related - 142 - pF RG Intrinsic gate resistance f = 1 MHz, ID=0 - 5 - Ω Qg Total gate charge VDD = 760 V, ID = 38 A VGS =10 V (see Figure 16: "Gate charge test circuit") - 93 - nC Qgs Gate-source charge - 18.7 - nC Qgd Gate-drain charge - 63.4 - nC Notes: (1)Time related is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80% VDSS (2)energy related is defined as a constant equivalent capacitance giving the same stored energy as Coss when VDS increases from 0 to 80% VDSS Table 6: Switching times Symbol Parameter Test conditions Min. Typ. Max Unit td(on) Turn-on delay time VDD = 475 V, ID = 19 A, RG = 4.7 Ω, VGS = 10 V (see Figure 15: "Switching times test circuit for resistive load") - 33.5 - ns tr Rise time - 51 - ns td(off) Turn-off-delay time - 91.5 - ns tf Fall time - 10 - ns |
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