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STM32L071KB Datasheet(PDF) 100 Page - STMicroelectronics

Part # STM32L071KB
Description  Access line ultra-low-power 32-bit MCU Arm®-based Cortex®-M0, up to 192KB Flash, 20KB SRAM, 6KB EEPROM, ADC
PDF  148 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32L071KB Datasheet(HTML) 100 Page - STMicroelectronics

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Electrical characteristics
STM32L071xx
100/148
DS10690 Rev 7
Figure 30. ADC accuracy characteristics
ET
Total unadjusted error
1.65 V < VREF+ <VDDA < 3.6 V,
range 1/2/3
-2
5
LSB
EO
Offset error
-
1
2.5
EG
Gain error
-
1
2
EL
Integral linearity error
-
1.5
3
ED
Differential linearity error
-
1
2
ENOB
Effective number of bits
10.0
11.0
-
bits
SINAD Signal-to-noise distortion
62
69
-
dB
SNR
Signal-to-noise ratio
61
69
-
THD
Total harmonic distortion
-
-85
-65
1. ADC DC accuracy values are measured after internal calibration.
2. ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-robust) analog input
pins should be avoided as this significantly reduces the accuracy of the conversion being performed on another analog
input. It is recommended to add a Schottky diode (pin to ground) to standard analog pins which may potentially inject
negative current.
Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 6.3.12 does not affect the ADC
accuracy.
3. Better performance may be achieved in restricted VDDA, frequency and temperature ranges.
4. This number is obtained by the test board without additional noise, resulting in non-optimized value for oversampling mode.
Table 64. ADC accuracy(1)(2)(3) (continued)
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
ET = total unajusted error: maximum deviation
between the actual and ideal transfer curves.
EO = offset error: maximum deviation
between the first actual transition and
the first ideal one.
EG = gain error: deviation between the last
ideal transition and the last actual one.
ED = differential linearity error: maximum
deviation between actual steps and the ideal ones.
EL = integral linearity error: maximum deviation
between any actual transition and the end point
correlation line.
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) End point correlation line
4095
4094
4093
7
6
5
4
3
2
1
0
23
4
5
6
1
7
4093 4094 4095 4096
VDDA
VSSA
EO
ET
EL
EG
ED
1 LSB IDEAL
(1)
(3)
(2)
MS19880V2



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