PPC5605BAMLL4R datasheet(112/114 Pages) NXP

112 / 114 page

MPC5607B Microcontroller Data Sheet, Rev. 10

Revision history

NXP Semiconductors

112

(cont’d)

08 Jul 2011 Section “External ballast resistor recommendations”: replaced “low voltage monitor” with

“low voltage detector (LVD)”

“I/O input DC electrical characteristics” table: updated ILKG characteristics

“MEDIUM configuration output buffer electrical characteristics” table: changed

“IOH = 100 µA” to “IOL = 100 µA” in VOL conditions

I/O weight: updated table (includes replacing instances of bit “SRE” with “SRC”)

“Reset electrical characteristics” table: updated parameter classification for |IWPU|

Updated voltage regulator electrical characteristics

Section “Low voltage detector electrical characteristics”: changed title (was “Voltage

monitor electrical characteristics”); changed “as well as four low voltage detectors” to

“as well as five low voltage detectors”; added event status flag names found in RGM

chapter of device reference manual to POR module and LVD descriptions; replaced

instances of “Low voltage monitor” with “Low voltage detector”; updated values for

VLVDLVBKPL and VLVDLVCORL

Updated section “Power consumption”

Section “Program/erase characteristics”: removed table “FLASH_BIU settings vs.

frequency of operation” and associated introduction

“Program and erase specifications” table: updated symbols

PFCRn settings vs. frequency of operation: replaced “FLASH_BIU” with “PFCRn” in table

title; updated field names and frequencies

“Flash power supply DC electrical characteristics” table: deleted footnote 2

Crystal oscillator and resonator connection scheme: inserted footnote about possibly

requiring a series resistor

Fast external crystal oscillator (4 to 16 MHz) electrical characteristics: updated parameter

classification for VFXOSCOP

Slow external crystal oscillator (32 kHz) electrical characteristics: updated footnote 1

Section “ADC electrical characteristics”: updated symbols for offset error and gain error

Section “Input impedance and ADC accuracy”: changed “VA/VA2” to “VA2/VA” in

Equation 11

ADC input leakage current: updated ILKG characteristics

ADC_0 conversion characteristics table: replaced instances of

“ADCx_conf_sample_input” with “INPSAMP”; replaced instances of

“ADCx_conf_comp” with “INPCMP

ADC_1 characteristic and error definitions: replaced “AVDD” with “VDD_ADC”

ADC_1 conversion characteristics table: replaced instances of

“ADCx_conf_sample_input” with “INPSAMP”; replaced instances of

“ADCx_conf_comp” with “INPCMP”

Updated “On-chip peripherals current consumption” table

Table 54. Revision history (continued)

Revision

Date

Substantive changes

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