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ATO25F1GC-30EC Datasheet(PDF) 8 Page - List of Unclassifed Manufacturers

Part # ATO25F1GC-30EC
Description  3.3V 1G-BIT Serial NAND Flash Memory with Quad SPI
PDF  46 Pages
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Manufacturer  ETC [List of Unclassifed Manufacturers]
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ATO25F1GC-30EC Datasheet(HTML) 8 Page - List of Unclassifed Manufacturers

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Sep.2013. Rev 0.5
1Gbit Serial NAND Flash Memory
1. General Description
The ATO25D1GA is 1G-bit with spare 32Mbit capacity. The device is offered in 3.3V power
supply. Its NAND cell provides the most cost-effective solution for the solid state mass storage
market. The memory is divided into blocks that can be erased independently so it possible to
preserve valid data while old data is erased. The device contains 1024 blocks, composed by
64 pages consisting in two NAND structures of 32series connected Flash Cells. A program
operation can be performed in typical 200us on the 2048-bytes and an erase operation can be
performed in typical 2ms on a 128K-bytes block. Data in the page can be read out at 25ns
cycle time per byte. The on-chip write control automates all program and erase functions
including pulse repetition, where required, and internal verification and margining of data. Even
the write-intensive systems can take advantage of the ATO25D1GA
’s extended reliability of
100K program/erase cycles by providing ECC(Error Correction Code) with real time
mapping-out algorithm.
ATO25D1GA features a serial peripheral interface and software protocol allowing operation
on a simple 3-wire bus while it is in single I/O mode. The three signals are a clock input(SCLK),
a serial data input(SI), and a serial data output(SO). Serial access to the device is enabled by
CS# input. When it is in four I/O read mode, the SI pin, SO pin, WP# pin and HOLD# pin
become SIO0 pin, SIO1 pin, SIO2 pin SIO3 pin for address/dummy bits input and data output.
The copy back function allows the optimization of defective blocks management : when a page
program operation fails the data can be directly programmed in another page inside the same
array section without the time consuming serial data insertion phase. The ATO25D1GA is an
optimum solution for large nonvolatile storage applications such as solid state file storage and
other portable applications requiring non-volatility.
After
program/erase
command
is
issued,
auto
program/erase
algorithms
which
program/erase and verify the specified page or sector/block locations will be executed. Up to
2Kbytes can be programmed at a time. Pages can be erased in groups of 128KB erase. To
provide user with ease of interface, a status register is included to indicate the status of the
chip. The status read command can be issued to detect completion status of a program or
erase operation via OIP bit. Advanced security features enhance the protection and security
functions, please see security features section for more details.
The ATO25D1GA supports JEDEC standard manufacturer and device identification with a
16Kbytes(8 pages) Secured OTP.
Figure 1. Logic Diagram
ATO25D1GA
SI(SIO0)
SCLK
CS#
W#(SIO2)
HOLD#(SIO3)
VCC
GND
SO(SIO1)



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