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CLC020 Datasheet(PDF) 8 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor. Click here to check the latest version.
Part # CLC020
Description  SMPTE 259M Digital Video Serializer with Integrated Cable Driver
PDF  15 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

CLC020 Datasheet(HTML) 8 Page - National Semiconductor (TI)

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Device Operation (Continued)
TABLE 1. BIST and Test Pattern Generator Control Functions
Pin
Name
Function
3
D0
TPG code input LSB
4
D1
TPG code input
5
D2
TPG code input
6
D3
TPG code input MSB
17
TPG_EN
TPG Enable, active high true
26
Test_Out
BIST Pass/Fail output. Pass=High
(See text for timing requirements)
TABLE 2. Component Video Test Pattern Selection
Standard
Frame
Test Pattern
D3
D2
D1
D0
NTSC
4x3
Flat-field black
0
0
0
0
NTSC
4x3
PLL pathological
0
0
0
1
NTSC
4x3
EQ pathological
0
0
1
0
NTSC
4x3
Color bars, 75%, 8-bars (modified, see text), BIST
0
0
1
1
PAL
4x3
Flat-field black
0
1
0
0
PAL
4x3
PLL pathological, BIST
0
1
0
1
PAL
4x3
EQ pathological
0
1
1
0
PAL
4x3
Color bars, 75%, 8-bars (modified, see text)
0
1
1
1
NTSC
16x9
Flat-field black
1
0
0
0
NTSC
16x9
PLL pathological
1
0
0
1
NTSC
16x9
EQ pathological
1
0
1
0
NTSC
16x9
Color bars, 75%, 8-bars (modified, see text)
1
0
1
1
PAL
16x9
Flat-field black
1
1
0
0
PAL
16x9
PLL pathological
1
1
0
1
PAL
16x9
EQ pathological
1
1
1
0
PAL
16x9
Color bars, 75%, 8-bars (modified, see text)
1
1
1
1
Note: D9 through D4 = 0 (binary)
10091707
FIGURE 6. Test Pattern Generator Control Sequence
www.national.com
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